1990
DOI: 10.1109/16.62297
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A closed-loop evaluation and validation of a method for determining the scattering limited carrier velocity in MOSFETs

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Cited by 6 publications
(3 citation statements)
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“…Some works have been reported where the procedure used has certain features in common with ours [20], [21]. However, there are significant differences between them.…”
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confidence: 99%
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“…Some works have been reported where the procedure used has certain features in common with ours [20], [21]. However, there are significant differences between them.…”
mentioning
confidence: 99%
“…Therefore, there is a higher amount of experimental data used in our method. Apart from that, the dependence of the electron mobility on the longitudinal electric field is obtained, which is not the case in [20] and [21].…”
mentioning
confidence: 99%
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