A Built-in-Self-Test Σ-Δ ADC Prototype

Hong, Hao-Chiao; Liang, Sheng-Chuan; Song, Hong-Chin

doi:10.1007/s10836-008-5095-x

Cited by 6 publications

(1 citation statement)

References 18 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…By changing their default connections, damaged blocks could be bypassed, for example, if some degree of redundancy is present in the circuit, leading to an increase of the yield of these circuits. By changing their operation, the performance of the blocks can be measured (Hong, Liang, & Song, 2009).…”

Section: Introductionmentioning

confidence: 99%

A Reconfiguration Method to Improve the Yield of Bandwidth-Limited Pipelined ADCs

Camarero

Lagziri

Suenaga

et al. 2012

International Journal of Measurement Technologies and Instrumentation Engineering

View full text Add to dashboard Cite

An off-line reconfiguration method is proposed for pipelined ADCs to improve their fabrication yield. Some nonlinearities generated by op amps in pipelined ADC stages depend on their bandwidth, while their equivalent input-referred errors depend on the stage position. From these premises, the method is conceived as a two steps process. During the first step, an alternate-test based technique determines the best stage, from the bandwidth point of view, as the front-end stage. In the second step, analog residue path interconnections and a stage scaling are configured according to the results from the first step. This method has been verified for a 10-bits ADC, designed in a 65 nm CMOS technology, by means of Monte Carlo simulations, with promising results.

show abstract

Section: Introductionmentioning

confidence: 99%