A low-cost output response analyzer for the built-in-self-test Σ-Δ modulator based on the controlled sine wave fitting method

Hung, Shao-Feng; Hong, Hao-Chiao; Liang, Sheng-Chuan

doi:10.1109/ats.2009.88

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A low-cost output response analyzer for the built-in-self-test Σ-Δ modulator based on the controlled sine wave fitting method

Cited by 3 publications

References 11 publications

Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform

Experimental Results of Testing a BIST Σ–Δ ADC on the HOY Wireless Test Platform

BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting

A Fully Integrated Built-In Self-Test S-? ADC on a Wireless Test Platform

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