A Build-in Self-Test Technique for RF Low-Noise Amplifiers

Abstract

A built-in self-test (BIST) technique suitable for RF low-noise amplifiers (LNAs) is presented in this paper. With fully integrated amplitude detectors and logarithmic amplifiers, the BIST module can be employed as a generic platform for gain extraction of the device-under-test (DUT) without expensive testing instruments, while maintaining a reasonable hardware overhead and minimum loading effects to the DUT. Using a 0.18-m CMOS process, a 5-GHz variable-gain LNA with the proposed BIST module is implemented. Based on the experimental results, on-chip gain extraction of the LNA has been demonstrated with an error less than 1 dB for various gain modes. The additional chip area required for the BIST functionality measures 0.042 mm 2 , which is considerably small compared with the physical size of the RF amplifiers.

Multivariate statistical techniques for analog parametric test metrics estimation

“…First, we record the output of the ED, then the input of the ED is switched to the output of the CS, in order to record the RMS value of the power supply current. The built-in test approach using envelope detectors and current sensors has been extensively studied in the literature [8][9][10][11][12]. It is cost-effective since only DC signals carrying RF information are extracted off-chip.…”

Analog and Mixed Signal Test

“…The first approach consists of embedding a signal generator and a test response analyzer into the chip [17,18,19,20,21,22,23], as shown in Fig. 4, whereas the second approach consists of embedding sensors into the chip to extract off-chip information-rich, low-cost test signatures from which the status of the performances can be implicitly inferred [24,25,26,27,28], as shown in Fig. 5.…”

“…Examples of alternate measurements for baseband analog circuits include sampling the output response when applying at the input a piecewise linear test stimulus [60,63], a multi-tone sinusoidal [72], or a pseudo-random bit sequence [73]. Popular approaches to extract alternate measurements from RF circuits include (a) applying a baseband multi-tone sinusoidal, up-converting it using a mixer that exists on the test load board or on-chip, down-converting the RF output using again a mixer, and sampling the demodulated baseband test response [64,65,73]; (b) sensors that tap into the RF signal path, for example, amplitude detectors [79,80,25,24,81,82,83] and current sensors [84,26,82].…”

“…Two types of sensors are most commonly used. The first type is an amplitude (or envelope) detector which provides a DC signature that carries information about the RF amplitude [79,80,25,24,81,82,83]. The second type is a current sensor which takes advantage of the small parasitic resistor (it can reach several ohms) of the line that connects the core of the CUT to the power supply pad [84,26,82].…”

A novel automated MOALO algorithm aided RF low‐noise amplifier design for wireless applications

“…This leads to new challenges with respect to its performance and mixed signal testing of RF transceivers. 12 The optimization of LNA was achieved with a reduction of the noise figure. The optimized CMOS distributive low noise amplifier is achieved with enhanced bandwidth cascode cells that has an inductor between common source and common gate while reducing input referred noise.…”