2019 IEEE International Electron Devices Meeting (IEDM) 2019
DOI: 10.1109/iedm19573.2019.8993487
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A 0.8 µm Smart Dual Conversion Gain Pixel for 64 Megapixels CMOS Image Sensor with 12k e- Full-Well Capacitance and Low Dark Noise

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Cited by 17 publications
(8 citation statements)
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“…26. Compared to front-side illumination (FSI), backside illumination (BSI) has become another standard image sensor technology due to its superior quantum efficiency and fill factor [249] . In event sensors, the BSI process can greatly increase the fill factor of complex pixels.…”
Section: High Speed Dynamic Vision Sensorsmentioning
confidence: 99%
“…26. Compared to front-side illumination (FSI), backside illumination (BSI) has become another standard image sensor technology due to its superior quantum efficiency and fill factor [249] . In event sensors, the BSI process can greatly increase the fill factor of complex pixels.…”
Section: High Speed Dynamic Vision Sensorsmentioning
confidence: 99%
“…Furthermore, the control logic proposed in Ref. [2,14,[22][23][24][25][26][27][28][29] is not suitable for continuous conversion, while the adaptive conversion logic can realise the continuous mode conversion without losing data.…”
Section: Overall Simulationmentioning
confidence: 99%
“…In addition, referred to the design in Ref. [27][28][29], due to the compatibility of dual gain, additional expansion capacitors have to be added, which leads to the increase in area. It is also noticeable that in Ref.…”
Section: Overall Simulationmentioning
confidence: 99%
“…Jang et al achieved excellent color sensitivity and signal-tonoise ratio (SNR) by using Tetra-and Nona-mode remosaic schemes, even under low illumination conditions [16], [17]. Park et al and Joe et al improved the sensitivity and Y-SNR by adopting a low-reflection material as the CF isolation grid in a buried CF structure [18], [19]. Huang et al and Yan et al fabricated a highly planarized coating film through a twostep spin-coating process [20] and spin-coating process with a vacuum treatment technique [21] on topographical substrates.…”
Section: Introductionmentioning
confidence: 99%