2013
DOI: 10.1109/tns.2013.2247630
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40 Years of Radiation Single Event Effects at the European Space Agency, ESTEC

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Cited by 11 publications
(4 citation statements)
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“…This may result in the degradation and ultimate failure of its electronic components due to ionization or displacement damage mechanisms (Daly et al, 1996;Feynman & Gabriel, 2000). Effects on electronics also include single event effects (SEEs) (Pellish et al, 2010); these appear when particles deposit sufficient energy or charge in a sensitive region of a component, with non-permanent (soft) errors such as bit flips, as well as, permanent (hard) errors such as latchups (i.e., SELs) and burnouts (SEBs) taking place (Sexton, 2003;Harboe-Sørensen, 2013). Furthermore, SEP events are a major threat to human spaceflight outside the protective shield of the Earth's magnetosphere (Bizzarri et al, 2017; and pose a severe danger for aircrews and passengers on polar flights (Mishev et al, 2015;Tobiska et al, 2015;Miroshnichenko, 2018).…”
Section: Introductionmentioning
confidence: 99%
“…This may result in the degradation and ultimate failure of its electronic components due to ionization or displacement damage mechanisms (Daly et al, 1996;Feynman & Gabriel, 2000). Effects on electronics also include single event effects (SEEs) (Pellish et al, 2010); these appear when particles deposit sufficient energy or charge in a sensitive region of a component, with non-permanent (soft) errors such as bit flips, as well as, permanent (hard) errors such as latchups (i.e., SELs) and burnouts (SEBs) taking place (Sexton, 2003;Harboe-Sørensen, 2013). Furthermore, SEP events are a major threat to human spaceflight outside the protective shield of the Earth's magnetosphere (Bizzarri et al, 2017; and pose a severe danger for aircrews and passengers on polar flights (Mishev et al, 2015;Tobiska et al, 2015;Miroshnichenko, 2018).…”
Section: Introductionmentioning
confidence: 99%
“…Effects on electronics also include single event effects (SEEs) (Pellish et al 2010), these appear when particles deposit sufficient energy or charge in a sensitive region of a component, with non-permanent (soft) errors such as bit flips, as well as, permanent (hard) errors such as latchups (i.e. SELs) and burnouts (SEBs) taking place (Sexton 2003;Harboe-Sørensen 2013). Furthermore, SEP events are a major threat to human spaceflight outside the protective shield of the Earth's magnetosphere (Bizzarri et al 2017;Townsend 2021) and pose a severe danger for aircrews and passengers on polar flights (Tobiska et al 2015;Mishev et al 2015;Miroshnichenko 2018).…”
Section: Introductionmentioning
confidence: 99%
“…Many efforts have been made in recent decades to measure, model, and mitigate radiation effects, applying numerous techniques and approaching the problem at various abstraction levels. There are three main research methods: mixed-level simulations, fault injection [7][8][9], and accelerated radiation ground testing [10,11].…”
Section: Introductionmentioning
confidence: 99%