Modeling and Experimental Study of Soft Error Propagation Based on Cellular Automaton

Abstract

Aiming to estimate SEE soft error performance of complex electronic systems, a soft error propagation model based on cellular automaton is proposed and an estimation methodology based on circuit partitioning and error propagation is presented. Simulations indicate that different fault grade jamming and different coupling factors between cells are the main parameters influencing the vulnerability of the system. Accelerated radiation experiments have been developed to determine the main parameters for raw soft error vulnerability of the module and coupling factors. Results indicate that the proposed method is feasible.

SEE Fault Sensitivity Analysis and Security Reinforcement Design for FPGA Circuits Based on Complex Network

“…However, there exist many high energy particles in the space environment, and the interaction of high energy particles with electronic components will cause SEEs (Single Event Effects). The SEE happens when the collected fraction of the charge liberated by the high energy particle might be larger than the electric charge stored on a sensitive node [5]. There are many manifestations of SEEs, such as SEU, MEU, SET, SEFI, etc., which will cause damage to the FPGA circuits to different degrees [4]- [6], [6]- [9].…”