Multiparametric Kelvin Probe Force Microscopy for the Simultaneous Mapping of Surface Potential and Nanomechanical Properties

Abstract

We report high-resolution multiparametric kelvin probe force microscopy (MP-KPFM) measurements for the simultaneous quantitative mapping of the contact potential difference (CPD) and nanomechanical properties of the sample in single-pass mode. This method combines functionalities of the force–distance-based atomic force microscopy and amplitude-modulation (AM) KPFM to perform measurements in single-pass mode. During the tip–sample approach-and-retract cycle, nanomechanical measurements are performed for the retract part of nanoindentation, and the CPD is measured by the lifted probe with a constant tip–sample distance. We compare the performance of the proposed method with the conventional KPFMs by mapping the CPD of multilayer graphene deposited on n-doped silicon, and the results demonstrate that MP-KPFM has comparable performance to AM-KPFM. In addition, the experimental results of a custom-fabricated polymer grating with heterogeneous surfaces validate the multiparametric imaging capability of the MP-KPFM. This method can have potential applications in finding the inherent link between nanomechanical properties and the surface potential of the materials, such as the quantification of the electromechanical response of the deformed piezoelectric materials.

Template‐Free Self‐Caging Nanochemistry for Large‐Scale Synthesis of Sulfonated‐Graphene@Sulfur Nanocage for Long‐Life Lithium‐Sulfur Batteries

“…Finally, the probe is lifted up to a constant distance. [ 43 ] Based on the FD curve, one can obtain considerable information related to the surface properties, such as (de‐)adhesion, the elastic (Young's) modulus, or energy dissipation. [ 42 ] The FD curves of GO, RGO, and SG are displayed in Figure 2e, compared with that of the Si substrate.…”

High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers

“…After the LCA was sufficiently dispersed into the PS trench, it was cured by irradiation with ultraviolet light (365 nm). The more detailed preparation process can be seen in previous research [30].…”

“…As shown in Fig. 1, the mechanical drive signal of the probe for each measurement cycle in the MP-KPFM [30] consists of two parts: a peak force drive signal (Gaussian wave, much lower than the first-order resonant frequency of the probe, f Gauss f 1st ) and a mechanical excitation with a small amplitude at its second-order resonant frequency (f 2nd ). Each measurement cycle is divided into four working periods.…”

“…However, the secondorder amplitude and phase of the composite probe remain approximately constant (in a steady state) after the probe is separated from the sample, which provides reliable feedback signals and sufficient time for the SP measurement. Since the relationship between the second-order phase of the probe and U DC is monotonic, the phase feedback has better anti-interference ability than the amplitude feedback, so the second-order phase is selected as the feedback signal for the SP measurement in the MP-KPFM measurement [30], [36].…”

“…Its mechanical bandwidth is increased by about 4 times compared to a silicon cantilever of similar stiffness. In our previously developed multiparametric Kelvin probe force microscope (MP-KPFM) [30], the SP is measured during lifting of the probe. After the tip and sample are separated, the cantilever requires a certain decay time to transit to a steady state [24], [31], and the required decay time is inversely related to the mechanical bandwidth of the probe.…”