Nanox: a miniature mechanical stress rig designed for near-field X-ray diffraction imaging techniques

Guéninchault, Nicolas; Proudhon, Henry; Ludwig, Wolfgang

doi:10.1107/s1600577516013850

Cited by 26 publications

(27 citation statements)

References 44 publications

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“…Measurements were done at beamline ID11 of the European Synchrotron Radiation Facility (ESRF). The sample was mounted into a small load frame NanoX (Gueninchault et al, 2016) placed on the rotation stage. The load frame was designed to enable full rotation scans and is made up of a quartz tube inside which the specimen is mounted between two anchoring pins.…”

Section: Sample Preparation and Mountingmentioning

confidence: 99%

Evaluation of grain-average stress tensor in a tensile-deformed Al–Mn polycrystal by high-energy X-ray diffraction

Renversade

Borbély

2017

J Appl Cryst

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International audienceThree-dimensional X-ray diffraction was applied to characterize the strain/stress evolution in individual grains of an Al-0.3 wt% Mn polycrystal deformed in situ at a synchrotron source. Methodological aspects concerning the calibration of the geometrical setup and the evaluation of the strain/stress tensors are discussed. A two-step calibration method separately treating the detector and the rotation axis allows one to determine the centre-of-mass position and crystallographic orientation of grains with standard errors of about 1.5 mm and 0.02 degrees, respectively. Numerical simulations indicate that the error of normal strain components (about 1 x 10(-4)) is mainly caused by calibration errors, while the error of shear components (about 0.5 x 10(-4)) is largely influenced by counting statistics and random spot-centre errors due to detector distortion. The importance of monitoring the beam energy is emphasized

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Section: Sample Preparation and Mountingmentioning

confidence: 99%

Evaluation of grain-average stress tensor in a tensile-deformed Al–Mn polycrystal by high-energy X-ray diffraction

Renversade

Borbély

2017

J Appl Cryst

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“…But resolving 3D grain shapes by near-field diffraction imaging requires to reduce the sample to detector distance to a few millimeters, which has for a long time drastically limited mechanical 4D studies due to the space constraints. Recent progresses with mechanical stress rigs solved this issue and opened new perspectives to study the deformation and fracture of polycrystalline materials [14,15].…”

Section: Of 18mentioning

confidence: 99%

“…A small tomographic tension specimen was mounted in the Nanox stress rig, specifically designed to be compatible with both DCT and Topotomography acquisition geometries [15], see Fig. 3 left.…”

Section: Details Of the In Situ Experimentsmentioning

confidence: 99%

“…. Sequence of the in-situ topotomography experiment: the initial microstructure is characterized by DCT and analyzed after mounting the specimen into the nanox device [29], then 23 complete sequences, each comprising three topotomography and one phase contrast tomography scan have been recorded at increasing levels of load (the color code used in the tension curve is used later on to plot results at a given load level).…”

Section: Details Of the In Situ Experimentsmentioning

confidence: 99%

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Incipient Bulk Polycrystal Plasticity Observed by Synchrotron in-situ Topotomography

Proudhon¹,

Guéninchault²,

Forest³

et al. 2018

Preprint

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In this paper, we present a comprehensive 4D study of the early stage of plastic deformation in a polycrystalline binary AlLi alloy. The entire microstructure is mapped with X-ray diffraction contrast tomography and a set of bulk grains is further studied via X-ray topotomography during mechanical loading. The observed contrast is analyzed with respect to the slip system activation and the evolution of the orientation spread is measured as a function of applied strain. The experimental observations are augmented by the mechanical response predicted by crystal plasticity finite element simulations to analyze the onset of plasticity in details. Simulation results show a general agreement of the individual slip system activation during loading and that comparison with experiments at the length scale of the grains may be used to fine tune the constitutive model parameters.

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“…The challenge is to experimentally obtain sufficient spatial resolution to capture plastic localization events such as slip bands, PSBs, shear bands, while investigating regions that are large enough to statistically capture the microstructures that influence properties such as fatigue. Current experimental techniques used to explore plastic localization include: in-situ transmission electron microscopy [11], micro-pillar compression [12], in-situ scanning electron microscopy [13e17], in-situ synchrotron experiments [18], and atomic force microscopy measurements [19,20]. However, all these techniques either probe small volumes of material or have complex boundary conditions that make them statistically non-representative.…”

Section: Introductionmentioning

confidence: 99%

Measurements of plastic localization by heaviside-digital image correlation

et al. 2018

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In polycrystalline metallic materials, quantitative and statistical assessment of the plasticity in relation to the microstructure is necessary to understand the deformation processes during mechanical loading. Plastic deformation often localizes into physical slip bands at the sub-grain scale. Detrimental microstructural configurations that result in the formation and evolution of slip bands during loading require advanced strain mapping techniques for the identification of these atomically sharp discontinuities. A new discontinuity-tolerant DIC method, Heaviside-DIC, has been developed to account for discontinuities in the displacement field. Displacement fields have been measured at the scale of the physical slip bands over large areas in nickel-based superalloys by high resolution scanning electron microscopy digital image correlation (SEM DIC). However, conventional DIC methods cannot quantitatively measure plastic localization in the presence of discontinuous kinematic fields such as those produced by slip bands. The Heaviside-DIC technique can autonomously detect discontinuities, providing information about their location, inclination, and identify slip systems (in combination with orientation mapping). Using Heaviside-DIC, discontinuities are physically evaluated as sharp shear-localization events, allowing for the quantitative measure of strain amplitude nearby the discontinuities. Measurements using the new Heaviside-DIC technique are compared to conventional DIC methods for identical materials and imaging conditions.

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Nanox: a miniature mechanical stress rig designed for near-field X-ray diffraction imaging techniques

Cited by 26 publications

References 44 publications

Evaluation of grain-average stress tensor in a tensile-deformed Al–Mn polycrystal by high-energy X-ray diffraction

Evaluation of grain-average stress tensor in a tensile-deformed Al–Mn polycrystal by high-energy X-ray diffraction

Incipient Bulk Polycrystal Plasticity Observed by Synchrotron in-situ Topotomography

Measurements of plastic localization by heaviside-digital image correlation

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