1998
DOI: 10.1590/s0366-69131998000600002
|View full text |Cite
|
Sign up to set email alerts
|

Microscopia de varredura por sonda mecânica: uma introdução

Abstract: A análise estrutural de materiais experimentou um grande avanço nos últimos anos, associado ao desenvolvimento das técnicas de Microscopia de Varredura por Sonda Mecânica, surgidas na década passada e consolidadas nos anos 90. Trata-se de um enfoque analítico inteiramente original, envolvendo conhecimento e tecnologia multidisciplinar, de amplo espectro de aplicação, devido, principalmente, à resolução em escala nanométrica, à facilidade de operação ao ar, em meio líquido e em vácuo e à possibilidade de grande… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
5
0
1

Year Published

2007
2007
2015
2015

Publication Types

Select...
6
1
1

Relationship

0
8

Authors

Journals

citations
Cited by 10 publications
(6 citation statements)
references
References 4 publications
0
5
0
1
Order By: Relevance
“…The appropriate morphology of nanocarriers is crucial in the designing of drug delivery systems used in diagnosis and therapy. AFM is a technique, with dimensional resolutions from 0.1 up to 10 nm, that offers a unique chance for visualizing nanoparticles in natural surroundings [ 35 ]. Furthermore, it allows direct measurement of size in dried state of probes, which lets contemporary characterization of nanoconstructs’ shape and structure.…”
Section: Resultsmentioning
confidence: 99%
“…The appropriate morphology of nanocarriers is crucial in the designing of drug delivery systems used in diagnosis and therapy. AFM is a technique, with dimensional resolutions from 0.1 up to 10 nm, that offers a unique chance for visualizing nanoparticles in natural surroundings [ 35 ]. Furthermore, it allows direct measurement of size in dried state of probes, which lets contemporary characterization of nanoconstructs’ shape and structure.…”
Section: Resultsmentioning
confidence: 99%
“…When the tip passes through a sample, the oscillation phase can change according to the different interaction conditions between the tip and the sample, resulting in phase image contrast [70] , and it is commonly used to distinguish different domains or different blend components [18] . According to Bokobza et al [71] , phase imaging provides variation of surface stiffness arising from differences in moduli between the components of a given system.…”
Section: De Sousa F D B; Scuracchio C H -The Use Of Atomic Formentioning
confidence: 99%
“…AFM is a powerful technique, with dimensional resolutions from 1 up to 100 Å, that provides a unique possibility for visualizing nanoparticles in a natural environment, without sample manipulation (Neves et al, 1998). While PCS measures hydrodynamic radius, the AFM technique allows direct measurement of size in samples in a partially dried state, deposited on freshly cleaved mica plates, which permits simultaneous characterization of particle shape and structure.…”
Section: Nanocapsule Characterizationmentioning
confidence: 99%