Surface roughness of thin gold films and its effects on the proton energy loss straggling

Abstract

We present a description of the effect of the surface roughness on the energy straggling associated to the energy loss distributions of protons transmitted through a self supported metallic thin foil. For this purpose we prepared a polycrystalline gold thin films using the standard sputtering method with different deposition rates. The statistics of the surface height distribution induced in these thin films were determined using Atomic Force Microscopy. The measured surface roughness allowed us to quantify the ion energy loss straggling in these samples for different deposition parameters and as a function of the incident ion energy.

Degradation of alkanethiol self‐assembled monolayers in mesenchymal stem cell culture

“…Using AFM, we analyzed the initial Au surface roughness for each of the metal thicknesses as shown in Supporting Information Figure S3B. The RMS roughness values obtained agree with what has previously been observed for electron beam evaporated nanometer‐scale Au films . We noted that the average RMS roughness did not change with Au thickness when analyzing several regions of the Au surface.…”

“…The RMS roughness values obtained agree with what has previously been observed for electron beam evaporated nanometer-scale Au films. 62 We noted that the average RMS roughness did not change with Au thickness when analyzing several regions of the Au surface. However, 10 and 4 nm Au both had approximately four times greater standard deviations for initial Au RMS roughness as compared to 8 nm Au, suggesting that those surfaces are significantly more heterogeneous than 8 nm Au, and may be more prone to SAM degradation.…”

Sensitive detection of voltage transients using differential intensity surface plasmon resonance system

“…As discussed in Pajkossy [45], the non-ideal surface structure showed a different capacitive behavior. On the other hand, the experimental results were obtained using polycrystalline surfaces [14,15,46] model to account for the effect of the roughness. The spatial profile of the capacitive properties of the interface has to be modeled with a lateral resolution that is sufficiently fine for the periodicity of the roughness.…”

Application of confocal surface wave microscope to self-calibrated attenuation coefficient measurement by Goos-Hänchen phase shift modulation

“… 17 . We will show in the later section that the measurement for the 34 nm case was a slight outlier because the relative roughness of thin gold samples is usually found to be greater 36 .…”

“…We believe that this explains the reason why the simplified Green’s model reflection spectra agree very well with the lower k- vector side of the BFP SP dips. The reason that the 34 nm case did not match very well was probably due to the roughness and the thin film quality 36 .

Figure 16 Shows the measured SP dips (blue curves) taken by the BFP camera in comparison with the calculated SP dips (red curves) calculated by the recovered k ″ Ω and k ″ c in Fig.

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