In this paper, we present a direct method to measure surface wave attenuation arising from both ohmic and coupling losses using our recently developed phase spatial light modulator (phase-SLM) based confocal surface plasmon microscope. The measurement is carried out in the far-field using a phase-SLM to impose an artificial surface wave phase profile in the back focal plane (BFP) of a microscope objective. In other words, we effectively provide an artificially engineered backward surface wave by modulating the Goos Hänchen (GH) phase shift of the surface wave. Such waves with opposing phase and group velocities are well known in acoustics and electromagnetic metamaterials but usually require structured or layered surfaces, here the effective wave is produced externally in the microscope illumination path. Key features of the technique developed here are that it (i) is self-calibrating and (ii) can distinguish between attenuation arising from ohmic loss (k″Ω) and coupling (reradiation) loss (k″c). This latter feature has not been achieved with existing methods. In addition to providing a unique measurement the measurement occurs of over a localized region of a few microns. The results were then validated against the surface plasmons (SP) dip measurement in the BFP and a theoretical model based on a simplified Green’s function.
In previous work we demonstrated how a confocal microscope with a spatial light modulator in the back focal plane could perform accurate measurement of the k-vector of a propagating surface plasmon. This involved forming an embedded interferometer between light incident close to normal incidence (reference beam) and light incident at the angle to excite surface plasmons (sample beam). The signal from the interferometer was extracted by stepping the phase of the reference beam relative to the sample beam using a spatial light modulator; this requires at least 3 phase steps, which limits the speed of operation. To overcome this and extract the same information with a single measurement, we project an azimuthal varying phase between 0 and 2π in the central region of the back focal plane; corresponding to small angles of incidence. This projects a vortex beam as the reference, so that the phase of the reference beam varies with azimuthal angle. By extracting the interference signal from different portions of the reference beam, different phase steps between the reference and the sample are obtained, so all the values required for phase reconstruction can be extracted simultaneously. It is thus possible to obtain the same information with a single shot measurement, at each defocus position, without additional changes to the back focal plane illumination. Results are presented to show that the vortex illuminated sample provides similar results to the phase stepped version, whose values are, in turn, validated with ellipsometry and surface profilometry.
The localized properties of surface plasmons (SPs) and surface waves can be measured with a modified confocal microscope. An interference signal arises from a locally generated reference close to normal incidence and the beam that forms the surface wave. A spatial light modulator can impose different phase shifts on the part of the incident light to recover the properties of the SP. We report a Hilbert transform method to recover the wavenumber with a single shot. The method is faster and potentially less expensive than previous approaches. The signal-to-noise ratio is equivalent to the phase-stepping method. The signal processing necessary to condition the signal is described.
Measurement of surface plasmon and surface wave propagation is important for the operation and characterization of sensors and microscope systems. One challenge is to perform these measurements both quickly and with good spatial resolution without any modification to the sample surface. This paper addresses these issues by projecting an image of the field excited from a defocused sample to a magnified image plane. By carefully analysing the intensity distribution in this plane the properties of the surface waves generated on the sample surface can be determined. This has the advantage over previous techniques that the data can be obtained in a single shot without any changes to the focal position of the sample. Equally importantly, we show the method measures the local properties of the sample at well-defined positions, whereas other methods such as direct observation of the back focal plane average the properties over the propagation length of the surface waves.
The reflected back focal plane from a microscope objective is known to provide excellent information of material properties and can be used to analyze the generation of surface plasmons and surface waves in a localized region. Most analysis has concentrated on direct measurement of the reflected intensity in the back focal plane. By accessing the phase information, we show that examination in the back focal plane becomes considerably more powerful allowing the reconstructed field to be filtered, propagated and analyzed in different domains. Moreover, the phase often gives a superior measurement that is far easier to use in the assessment of the sample, an example of such cases is examined in the present paper. We discuss how the modified defocus phase retrieval algorithm has the potential for real time measurements with parallel image acquisition since only three images are needed for reliable retrieval of arbitrary distributions.
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