2019
DOI: 10.1590/1806-9126-rbef-2018-0272
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Temperature influence on mobility and charge density model of photovoltaic cells

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Cited by 3 publications
(9 citation statements)
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“…Reggiani et al (2000) showed the strong decrease of the mobility of the electrons and the holes with temperature increase in silicon devices. In the same direction, Souza and Sousa (2019) have shown that temperature increase leads to a decrease of the mobility of the electrons and the holes. They also showed that the intrinsic carrier density and the reverse saturation current density increase with temperature increase.…”
Section: Introductionmentioning
confidence: 86%
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“…Reggiani et al (2000) showed the strong decrease of the mobility of the electrons and the holes with temperature increase in silicon devices. In the same direction, Souza and Sousa (2019) have shown that temperature increase leads to a decrease of the mobility of the electrons and the holes. They also showed that the intrinsic carrier density and the reverse saturation current density increase with temperature increase.…”
Section: Introductionmentioning
confidence: 86%
“…(1) The electrons and the holes mobility ( , np m ) coefficients are (Souza and Sousa, 2019;Dhar et al, 2005;Savadogo et al, 2020):…”
Section: The Silicon Intrinsic Propertiesmentioning
confidence: 99%
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“…Many authors [10]- [20] have shown that temperature has harmful effects on all electronic and electrical parameters of a silicon solar cell. However, these authors did not work under concentrated light.…”
Section: Introductionmentioning
confidence: 99%