The influence of cryothermal treatment on the mechanical properties of metallic glasses with different compositions was investigated in the present work. It was found that cryothermal cycling can induce rejuvenation as well as relaxation of the metallic glasses. The local apparent Young's modulus and its spatial distribution width on the surface of the metallic glass increase after cryothermal cycling, while in the bulk the effect depends on the glass composition. It appeared that this increase is temporary and disappears after a period of room temperature aging. This effect is connected with a large distribution of relaxation times in the metallic glasses due to their heterogeneous structure and the formation of complex native oxides on the outer surfaces of the glasses. Our findings reveal that a cryothermal cycling treatment can improve or degrade the plasticity of a metallic glass, and the atomic bond structure appears to be very important for the outcome of the treatment.

We analyze the evolution of the normal and superconducting electronic properties in epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of the residual resistivity, which becomes dominated by diffusive surface scattering for d ≤ 20 nm. At the same time, a substantial thicknessdependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such a high quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of ∼ 10 12 cm −2 . Our results suggest that surface magnetic disorder is generally present in oxidized TiN films. arXiv:1903.05009v3 [cond-mat.mtrl-sci]

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In the paper, we propose XPS-based quantitative method for depth profile analysis of chemical and phase composition of multi-component and multi-layer samples. The method includes: (1) new method for background subtraction accounting for depth non-uniformity of electron energy losses; (2) new method for photoelectron line decomposition into elementary peaks, which accounts for physical nature of the decomposition parameters; (3) joint solving of both background subtraction and photoelectron line decomposition problems; (4) criterion for assessing of line decomposition accuracy; (5) simple formula for layer thickness extraction for multi-element and multi-layer sample. We apply the developed method for analysis of multilayer niobium oxide and sub-oxide films before and in course of ion milling.

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