With the rapid development of the Internet-of-Things (IoT), sensors are being widely applied in industry and human life. Sensor networks based on IoT have strong Information transmission and processing capabilities. The security of sensor networks is progressively crucial. Cryptographic algorithms are widely used in sensor networks to guarantee security. Hardware implementations are preferred, since software implementations offer lower throughout and require more computational resources. Cryptographic chips should be tested in a manufacturing process and in the field to ensure their quality. As a widely used design-for-testability (DFT) technique, scan design can enhance the testability of the chips by improving the controllability and observability of the internal flip-flops. However, it may become a backdoor to leaking sensitive information related to the cipher key, and thus, threaten the security of a cryptographic chip. In this paper, a secure scan test architecture was proposed to resist scan-based noninvasive attacks on cryptographic chips with boundary scan design. Firstly, the proposed DFT architecture provides the scan chain reset mechanism by gating a mode-switching detection signal into reset input of scan cells. The contents of scan chains will be erased when the working mode is switched between test mode and functional mode, and thus, it can deter mode-switching based noninvasive attacks. Secondly, loading the secret key into scan chains of cryptographic chips is prohibited in the test mode. As a result, the test-mode-only scan attack can also be thwarted. On the other hand, shift operation under functional mode is disabled to overcome scan attack in the functional mode. The proposed secure scheme ensures the security of cryptographic chips for sensor networks with extremely low area penalty.
Wireless sensor networks (WSN) have deeply influenced the working and living styles of human beings. Information security and privacy for WSN is particularly crucial. Cryptographic algorithms are extensively exploited in WSN applications to ensure the security. They are usually implemented in specific chips to achieve high data throughout with less computational resources. Cryptographic hardware should be rigidly tested to guarantee the correctness of encryption operation. Scan design improves significantly the test quality of chips and thus is widely used in semiconductor industry. Nevertheless, scan design provides a backdoor for attackers to deduce the cipher key of a cryptographic core. To protect the security of the cryptographic system we first present a secure scan architecture, in which an automatic test control circuitry is inserted to isolate the cipher key in test mode and clear the sensitive information at mode switching. Then, the weaknesses of this architecture are analyzed and an enhanced scheme using concept of test authorization is proposed. If the correct authorization key is applied within the specific time, the normal test can be performed. Otherwise, only secure scan test can be performed. The enhanced scan scheme ensures the security of cryptographic chips while remaining the advantages of scan design.
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