As the feature sizes of integrated circuits decreasing, single event transient (SET) in combinational circuits can not been ignored any longer. In this paper, a novel fault-secure scheme for memory has been proposed by studying the structural features of Euclidean Geometry-Low Density Parity Check (EG-LDPC) codes. The proposed fault-secure scheme can tolerate transient faults both in the storage cell and in the encoder and decoder, using the parallel majority decoding and the feedback loop structure. In order to improve the decoding speed, an algorithm is presented, which can reduce the majority decoding of EG-LDPC codes into two steps. Furthermore, the proposed scheme can suit ordinary data width (e.g., 2 n bits) in memory. Finally, the correcting capability and the reliability of the proposed scheme are analyzed. The experiment results reveal that the Mean Time to Failure (MTTF) of the proposed scheme is 419%, 104% and 118% compared with that of Hamming code, Matrix code and Reed-Muller code, respectively.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.
customersupport@researchsolutions.com
10624 S. Eastern Ave., Ste. A-614
Henderson, NV 89052, USA
Copyright © 2024 scite LLC. All rights reserved.
Made with 💙 for researchers
Part of the Research Solutions Family.