High quality Tl 2 Ba 2 CaCu 2 O 8 (Tl-2212) superconducting thin films were fabricated on 2 inch double-sided CeO 2 buffered r-cut sapphire substrates. The metal cerium target was used as the sputtering source to deposit the CeO 2 buffer layer by the RF magnetron reactive sputtering technique, and the inter-diffusion of chemical elements between the CeO 2 layer and the substrate was studied by XPS depth profiling. The crack-free Tl-2212 films with dense crystal structure and smooth morphology were homogeneous over the whole area of the film. The XRD measurement confirmed the purity of the Tl-2212 phase and the texture with c axis perpendicular to the surface of the CeO 2 buffered sapphire substrate. The electrical and magnetic measurements on the Tl-2212 films showed that the transition temperature T c was around 106 K, and the critical current densities J c (77 K, 0 T) for both side films were 2.9 ± 0.1 MA cm −2 and 1.6 ± 0.2 MA cm −2 , respectively. The microwave surface resistance R s on one side film was about 390 μ and on the other side 450 μ at 10 GHz and 77 K.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.