The phenomenon of low-temperature homogenization (LTH) during interdiffusion is studied under condition a t Dv £ 2 / 1 ) ( (Dv is the bulk diffusion coefficient, a is the lattice parameter) using nano-objects of binary Cu-Ni and Cr-Ni systems compacted from nano-powders and produced by mechanical alloying. Two stages of LTH were detected: at the first stage (t £ 103 s) the volume fraction of solution rapidly grows; at the second stage (t > 103 s) the volume fraction of solutions grows slowly with practically constant average solution concentration. The first stage of LTH correlates with active grain growth caused by small size (l) of structural element and nonequilibrium structure of nano-objects. Obtained results are analyzed theoretically in terms of interdiffusion along migrating GBs due to grain growth at the first stage and DIGM mechanism at the second stage. It is shown that the GB concentration distribution during interdiffusion along migrating GBs and the kinetics of LTH depend on a parameter l/l where 2 / 1 ) / ( b b V sD d l= is the
characteristic diffusion length. The mechanisms and criteria of LTH are proposed.
The kinetics of intermetallic growth in the bulk, along the surface and grain boundaries (GBs) was studied in the Cd-Ni, Cd-Cu and Cu-Sn systems. Bulk dynamic diffusion coefficients exceed by a few orders of magnitudes the tracer self-diffusion coefficients in homogeneous phases. The reasons for this difference are discussed in terms of departure of growing intermetallics from stoichiometry due to the simultaneous existence of two processes: interdiffusion through the growing phase layer and chemical reactions at interfaces. Accelerating contribution of GBs and free surfaces, as fast diffusion paths, into diffusion penetrability of growing intermetallics has been investigated. It was found that the rates of lateral phase spreading along free surfaces and GBs exceed several times the rate of phase growth in the bulk. Accelerating GB contribution depends on the grain size. Nano-dispersed thin films demonstrate maximal phase propagation rates, which several times exceed even the rates of lateral phase spreading along free surfaces in coarse-grained polycrystals.
We propose a simple method for calculation of surface self-diffusion coefficients using kinetic data on the decay of thin films – void growth and transformation of the island shape to the equilibrium. Calculations are made taking into account equilibrium wetting angle of the film on a substrate. The kinetic data on the decay of Pd thin films on sapphire and silica substrates were obtained using Auger electron spectroscopy. By in situ monitoring the intensity of the Auger signal from the film, three different stages of the decay could be distinguished. The surface self-diffusion
coefficients were calculated for the temperature range 583 – 823 K. The values of the surface diffusion coefficients and the activation energies are discussed compared to those obtained by other methods.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.