In this paper, the ZnO/Cu2S/ZnO complex films were fabricated by Radio Frequency (RF) magnetron sputtering, and their transparent, conductive and photocatalytic properties have been investigated. The results show the properties of ZnO/Cu2S/ZnO complex films vary when the top layer ZnO thickness changes.
The V2O5films were prepared by the (radio frequency)RF sputtering. The transmission of the samples under different deposition pressures and different Ar/O2flow ratios was investigated to determine the fundamental preparation condition for the further analysis. On the fundamental condition, the security volt of V2O5was determined. It is concluded that the annealing makes the V2O5films have a good reversibility but lowers the electrochromic property.
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