Aberration-corrected optics have made electron microscopy at atomic resolution a widespread and often essential tool for characterizing nanoscale structures. Image resolution has traditionally been improved by increasing the numerical aperture of the lens (α) and the beam energy, with the state-of-the-art at 300 kiloelectronvolts just entering the deep sub-ångström (that is, less than 0.5 ångström) regime. Two-dimensional (2D) materials are imaged at lower beam energies to avoid displacement damage from large momenta transfers, limiting spatial resolution to about 1 ångström. Here, by combining an electron microscope pixel-array detector with the dynamic range necessary to record the complete distribution of transmitted electrons and full-field ptychography to recover phase information from the full phase space, we increase the spatial resolution well beyond the traditional numerical-aperture-limited resolution. At a beam energy of 80 kiloelectronvolts, our ptychographic reconstruction improves the image contrast of single-atom defects in MoS substantially, reaching an information limit close to 5α, which corresponds to an Abbe diffraction-limited resolution of 0.39 ångström, at the electron dose and imaging conditions for which conventional imaging methods reach only 0.98 ångström.
Hierarchical porous polymer materials are of increasing importance because of their potential application in catalysis, separation technology, or bioengineering. Examples for their synthesis exist, but there is a need for a facile yet versatile conceptual approach to such hierarchical scaffolds and quantitative characterization of their nonperiodic pore systems. Here, we introduce a synthesis method combining well-established concepts of macroscale spinodal decomposition and nanoscale block copolymer self-assembly with porosity formation on both length scales via rinsing with protic solvents. We used scanning electron microscopy, small-angle x-ray scattering, transmission electron tomography, and nanoscale x-ray computed tomography for quantitative pore-structure characterization. The method was demonstrated for AB- and ABC-type block copolymers, and resulting materials were used as scaffolds for calcite crystal growth.
Further reduction of Pt in hydrogen fuel cells is hampered by reactant transport losses near the catalyst surface, especially for degraded catalysts. Strategically mitigating these performance losses requires an improved understanding of the catalyst nanostructure, which controls local transport and catalyst durability. We apply cryo-tomography in a scanning transmission electron microscope (STEM) to quantify the three-dimensional structure of carbon-supported Pt catalysts and correlate to their electrochemical accessibility. We present results for two carbon supports: Vulcan, a compact support with a large majority of Pt observed on the exterior, and HSC, a porous support with a majority of Pt observed within interior carbon pores, which have relatively constrictive openings. Increasing Pt content shifts the Pt distribution to the exterior on both carbon supports. By correlating to the electrochemical surface area, we find that all Pt surface area is accessible to protons in liquid. However, the interior Pt fraction quantitatively tracks Pt utilization losses at low humidity, indicating that the interior Pt is inaccessible to the proton-conducting ionomer, likely because narrow carbon pore openings block ionomer infiltration. These results imply different proton transport mechanisms for interior and exterior Pt, and quantitatively describe the catalyst structure, supporting development of transport and durability models.
Nanoparticle electrodes in lithium-ion batteries have both near-surface and interior contributions to their redox capacity, each with distinct rate capabilities. Using combined electron microscopy, synchrotron X-ray methods and ab initio calculations, we have investigated the lithiation pathways that occur in NiO electrodes. We find that the near-surface electroactive (Ni(2+) → Ni(0)) sites saturated very quickly, and then encounter unexpected difficulty in propagating the phase transition into the electrode (referred to as a "shrinking-core" mode). However, the interior capacity for Ni(2+) → Ni(0) can be accessed efficiently following the nucleation of lithiation "fingers" that propagate into the sample bulk, but only after a certain incubation time. Our microstructural observations of the transition from a slow shrinking-core mode to a faster lithiation finger mode corroborate with synchrotron characterization of large-format batteries and can be rationalized by stress effects on transport at high-rate discharge. The finite incubation time of the lithiation fingers sets the intrinsic limitation for the rate capability (and thus the power) of NiO for electrochemical energy storage devices. The present work unravels the link between the nanoscale reaction pathways and the C-rate-dependent capacity loss and provides guidance for the further design of battery materials that favors high C-rate charging.
Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. However, owing to lens aberrations and multiple scattering of electrons in the sample, the image resolution is reduced by a factor of 3 to 10. By inversely solving the multiple scattering problem and overcoming the electron-probe aberrations using electron ptychography, we demonstrate an instrumental blurring of less than 20 picometers and a linear phase response in thick samples. The measured widths of atomic columns are limited by thermal fluctuations of the atoms. Our method is also capable of locating embedded atomic dopant atoms in all three dimensions with subnanometer precision from only a single projection measurement.
State-of-the-art halide perovskite solar cells have bandgaps larger than 1.45 eV, which restricts their potential for realizing the Shockley-Queisser limit. Previous search for lowbandgap (1.2 to 1.4 eV) halide perovskites has resulted in several candidates, but all are hybrid organic-inorganic compositions, raising potential concern regarding device stability. Here we show the promise of an inorganic low-bandgap (1.38 eV) CsPb 0.6 Sn 0.4 I 3 perovskite stabilized via interface functionalization. Device efficiency up to 13.37% is demonstrated. The device shows high operational stability under one-sun-intensity illumination, with T 80 and T 70 lifetimes of 653 h and 1045 h, respectively (T 80 and T 70 represent efficiency decays to 80% and 70% of the initial value, respectively), and long-term shelf stability under nitrogen atmosphere. Controlled exposure of the device to ambient atmosphere during a long-term (1000 h) test does not degrade the efficiency. These findings point to a promising direction for achieving low-bandgap perovskite solar cells with high stability.
Both high resolution and high precision are required to quantitatively determine the atomic structure of complex nanostructured materials. However, for conventional imaging methods in scanning transmission electron microscopy (STEM), atomic resolution with picometer precision cannot usually be achieved for weakly-scattering samples or radiation-sensitive materials, such as 2D materials. Here, we demonstrate low-dose, sub-angstrom resolution imaging with picometer precision using mixed-state electron ptychography. We show that correctly accounting for the partial coherence of the electron beam is a prerequisite for highquality structural reconstructions due to the intrinsic partial coherence of the electron beam. The mixed-state reconstruction gains importance especially when simultaneously pursuing high resolution, high precision and large field-of-view imaging. Compared with conventional atomic-resolution STEM imaging techniques, the mixed-state ptychographic approach simultaneously provides a four-times-faster acquisition, with double the information limit at the same dose, or up to a fifty-fold reduction in dose at the same resolution.
To date, high-resolution (< 1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberrationcorrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions of larger specimens (> 6 nm) to appear blurred or missing. Here we demonstrate a three-dimensional imaging method that overcomes both these limits by combining through-focal depth sectioning and traditional tilt-series tomography to reconstruct extended objects, with high-resolution, in all three dimensions. The large convergence angle in aberration corrected instruments now becomes a benefit and not a hindrance to higher quality reconstructions. A through-focal reconstruction over a 390 nm 3D carbon support containing over one hundred dealloyed and nanoporous PtCu catalyst particles revealed with sub-nanometer detail the extensive and connected interior pore structure that is created by the dealloying instability. IntroductionWith electron beams smaller than the bond length of hydrogen, aberration-corrected scanning transmission electron microscopes (STEM) can image materials with resolutions below the shortest bond lengths in nature 1 . However, these atomic resolution images are only 2D projections of a specimen. In order to determine the full 3D structure, one must acquire a series of STEM images over a range of specimen tilts 2,3 . Unfortunately, the resolution of a 3D STEM tomogram is degraded by missing information that is a consequence of the restricted specimen tilt range and finite tilt increments. While reconstructions of small objects have been reported at atomic resolution 4,5 , resolution places fundamental limitations to object-size. For larger objects (> 20 nm), the Crowther condition 1,6 discussed below typically limits volumetric resolutions of electron tomography to roughly 1 nm-twenty times worse than the best resolution in 2D projections. In addition, high-resolution (< 1 nm) tomography of general extended objects, to date, has not been possible with aberration-corrected instruments because the depth-of-field (5 -10 nm) of aberration-corrected STEMs is smaller than most objects of interest today 7 . High-resolution 3D reconstruction of extended objects, i.e. those larger than the depth-of-field, requires collecting information beyond a traditional tilt series. Here we present through-focal tomography that combines depth sectioning and traditional tilt-tomography to reconstruct extended objects, with highresolution, in three-dimensions. This combined approach fills in missing 3D information by acquiring a through-focal image series at each specimen tilt (Fig. 1)-decoupling the limiting Crowther relationship between 3D resolution and object size.For traditional (S)TEM tomography the images at every tilt-angle must correspond to a perfect projection of the original object to fulfill the "projection requ...
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