The interface hole trap distribution in nitrided oxide (NOX), re-oxidized nitrided oxide (RNOX), and thermal oxide are studied and are compared in detail utilizing the deep level transient spectroscopy (DLTS) measurement. Results show that nitrided oxides have larger amount of hole traps than the thermal oxide. Most of the hole trapping centers in NOX layers are due to the oxygen deficiency as a result of oxygen removal during the nitridation. For RNOX sample, the amount oxygen deficiency centers are reduced by re-oxidation and the non-bridging oxygen could be a major source of hole traps. In addition, we found that the hole emissions of the trapping centers in NOX and RNOX samples also follow the lattice relaxation multiphonon emission model as used in thermal oxide.
Simplicity is the major advantage of implementing hardware IP lookup engine using multi-level index tables. However, the memory efficiency of the conventional multi-level indexing approach is relatively low. In this paper we shall show that by restructuring the binary-trie using a method called bitshuffling, highly efficient index tables can be built to support the IP lookup operation. The proposed method is evaluated using a real-life IPv4 routing table with 321K prefixes. The amortized memory cost of our method is less than 3 bytes per prefix.
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