Metals support surface plasmons at optical wavelengths and have the ability to localize light to sub-wavelength regions. The field enhancements that occur in these regions set the ultimate limitations on a wide range of nonlinear and quantum optical phenomena. Here we show that the dominant limiting factor is not the resistive loss of the metal, but the intrinsic nonlocality of its dielectric response. A semi-classical model of the electronic response of a metal places strict bounds on the ultimate field enhancement. We demonstrate the accuracy of this model by studying the optical scattering from gold nanoparticles spaced a few angstroms from a gold film. The bounds derived from the models and experiments impose limitations on all nanophotonic systems.

Nanoshell arrays have recently been found to possess ideal properties as a substrate for combining surface enhanced raman scattering (SERS) and surface enhanced infrared absorption (SEIRA) spectroscopies, with large field enhancements at the same spatial locations on the structure. For small interparticle distances, the multipolar plasmon resonances of individual nanoshells hybridize and form red-shifted bands, a relatively narrow band in the near-infrared (NIR) originating from quadrupolar nanoshell resonances enhancing SERS, and a very broadband in the mid-infrared (MIR) arising from dipolar resonances enhancing SEIRA. The large field enhancements in the MIR and at longer wavelengths are due to the lightning-rod effect and are well described with an electrostatic model.

The wave nature of light limits the spatial resolution in classical microscopy to about half of the illumination wavelength. Recently, a new approach capable of achieving subwavelength spatial resolution, called superlensing, was invented, challenging the already established method of scanning near-field optical microscopy (SNOM). We combine the advantages of both techniques and demonstrate a novel imaging system where the objects no longer need to be in close proximity to a near-field probe, allowing for optical near-field microscopy of subsurface objects at sub-wavelength-scale lateral resolution.