Tin thin films were coated on copper substrates using chemical method. Tin coated copper specimens under continuously applied compressive and tensile stresses were oxidised at 100uC for 8 days. Protrusion and whisker growth behaviour of tin coated copper specimens was characterised by scanning electron microscope, X-ray diffractometer and transmission electron microscope. The results show that continuously applied compressive stress on tin coated copper specimens would enhance the growth of whisker while tensile stress would reduce whisker growth. A SnO 2 layer was formed during oxidation and intermetallics of Cu 3 Sn and Cu 6 Sn 5 were formed between SnO 2 layer and copper substrate, which built up the residual compressive stresses in the coated tin layer. Continuously applied stress on the specimens can change the magnitude of residual compressive stress in coated tin layer, which affects the driving force for protrusion and whisker formation and growth.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.