No abstract

This work analyses the three-dimensional (3-D) surface texture of carbon-nickel (C-Ni) films grown by radio frequency (RF) magnetron co-sputtering on glass substrates. The C-Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3-D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non-metal content mode.This behavior demonstrated a strong link between the structural and morphological properties of C-Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high-quality C-Ni films.carbon-nickel composite thin films, fractal analysis, RF magnetron co-sputtering, three-dimensional surface micromorphology wileyonlinelibrary.com/journal/jemt

This paper analyses the three-dimensional (3-D) surface texture of growing diamond nanocrystals on Au thin films as catalyst on p-type Si substrate using hot filament chemical vapour deposition (HFCVD). Rutherford backscattering spectrometry (RBS), atomic force microscopy (AFM), Raman, X-ray diffraction (XRD) and scanning electron microscopy (SEM) analyses were applied also to characterize the 3-D surface texture data in connection with the statistical, and fractal analyses. This type of 3-D morphology allows a deeper understanding of structure/property relationships and surface defects in prepared samples. Our results indicate a promising way for preparing high-quality diamond nanocrystals on Au thin films as catalyst on p-type Si substrate via HFCVD method.

No abstract

No abstract