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We introduce a model for hydrogen induced blister formation in nanometer thick thin films. The model assumes that molecular hydrogen gets trapped under a circular blister cap causing it to deflect elastically outward until a stable blister is formed. In the first part, the energy balance required for a stable blister is calculated. From this model, the adhesion energy of the blister cap, the internal pressure and the critical H-dose for blister formation can be calculated. In the second part, the flux balance required for a blister to grow to a stable size is calculated. The model is applied to blisters formed in a Mo/Si multilayer after being exposed to hydrogen ions. From the model the adhesion energy of the Mo/Si blister cap was calculated to be around 1.05 J/m 2 with internal pressures in the range of 175-280 MPa. Based on the model a minimum ion dose for the onset of blister formation was calculated to be d = 4.2 × 10 18 ions/cm 2 . From the flux balance equations the diffusion constant for the Mo/Si blister cap was estimated to be D H2 = (10 ± 1) × 10 −18 cm 2 /s.

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The paper examines the compressibility of media with nano-inhomogeneities using the example of an aluminum melt and C60 fullerenes immersed in it. The results of molecular dynamics simulations indicate a significant effect of the interface on the effective compressibility of a heterogeneous medium. It is found that the application of the rule of mixture for the Al/C60 system results in an incorrect qualitative picture of the dependence of compressibility on the concentration of fullerenes. To explain this effect, an analytical model is proposed that takes into account the reduction in distances between atoms of different components during compression. The model makes it possible to estimate the effective mechanical characteristics of a liquid with nano-inhomogeneities within the framework of the mechanical approach, and correctly predicts the nature of the change in the dependence of compressibility on concentration.