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Cu2O/xCu (x=0–25 wt%) cermets were evaluated as a novel partially inert anode for aluminum (Al) production. The physical and mechanical properties, including the compressive strength, flexural strength, thermal expansion coefficient, thermal conductivity, and dc electrical conductivity were tested at room temperature and at temperatures up to 950°C. The coefficient of thermal expansion, compressive strength, flexural strength, thermal conductivity, and electrical conductivity of Cu2O/Cu cermets increased with increasing Cu content. High‐temperature electrical conductivity measurements showed that with increasing temperature, the electrical conductivity increased when the Cu content was below the percolation threshold, while it decreased when the Cu content was above the percolation threshold. A relatively stable CuAlO2 layer formed on the cermet surface during electrochemical testing, and the corrosion rate of this anode was estimated to be about 1.8–1.9 cm/year in Al production.