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The previous studies on the behaviors of ferroelectric domains under applied electric fields were made by a number of researchers, e.g. Merz and Little on bulk BaTiO3 crystals with optical microscopy. It was suggested that under the applied electric field the new antiparallel domains nucleated and grew and 90° and 180° domains nucleated and grew sidewise. However, those results and conclusions were obtained from the experiments on large bulk crystals with optical microscopy of relatively lower magnification and resolution. TEM is a very powerful tool in the study of crystal structure and defects and may provide a new interpretation to the study of microdomains of hundred angstroms in thin ferroelectric films with a higher magnification and resolution and may be combined with electron diffraction. However, no reference has been found that an in-situ TEM study of the behaviors of ferroelectric materials under applied electric fields has ever been made.