As we move into the system-on-chip era, test costis becoming a of the total cost. Similarly, test synthesis, test pattern generation, pattern compression and pattern validation are consuming portion of the design cycle time. The volume of test generation and validation is high due to the size of the designs as well as the types of tests that are required to be runscan test patternsfor stuck-at and tests, logic and memory BIST patterns, tests, bum-in tests, and several miscellaneous tests. Designs cannot be taped out without validated test patterns. At the same time, since design timing closure takes up a significant portwn of the project time and the timing is not available until late in the schedule, there is immense pressure on the DFT team to generate and validate patterns in a small time Thispaper describes a for which exploits both hierarchy and the inherent parallelism in the jobs to run the jobs in a computing environment so as to minimize the runtime impact.
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