The thermoelectric properties of thin films based on compounds PbSnAgTe, obtained by condensation of vapor on the high vacuum on mica substrate are researched. Based on a two-layer model Petrits are founded electrical parameters of surface layers. It is shown that condensates thickness d < 500 nm are characterized by improved thermoelectric properties.
The analysis was obtained by atomic force microscopy method of topograms nanostructures on the surface of vapor-phase condensation of SnTe: Bi, thet were opened deposited by evaporation in a vacuum on substrates of ceramics. With the distribution of polar and azimuthal angles of the normal vector to the surface elements of condensate was found objects with flat faces with by dominant orientation in space and by symmetry.
The influence of the thickness of thin films based on compounds SnTe: Sb, deposited on Sital substrates at their structure and mechanisms of carrier scattering are researched. The dominant role of scattering on the surface due to the increasing size of nanocrystals with increasing of thickness vapor-phase structures are defined.
The thermoelectric properties of thin films Pb 18 Ag 2-x SbxTe 20 , obtained by condensation of vapor on the high vacuum on mica substrate are researched. Based on a two-layer model Petrits are founded electrical parameters of surface layers. It is shown that condensates thickness d <1 micron are characterized by improved thermoelectric properties.
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