PurposeTo study nonreciprocal effects in microstrip components due to ferrite thin film overlay.Design/methodology/approachThe possibility of obtaining non reciprocal characteristics in the X band microwave region in the absence of external magnetic field by a simple process of using Mg, Co, Zn ferrite thin films as in‐touch overlay over λ/2 microstrip rejection filter was investigated. Microstrip rejection filter is basically a reciprocal component. The ferrite thin films were deposited by electroless plating.FindingsIt was found that frequency, pH and ferrite overlay material dependent changes occurred and differences in forward and reverse loss also observed, in some cases greater than 30 dB. Owing to the overlay the rejection properties of the filter is lost and there is an increase in insertion loss. The best non reciprocal effects are seen at higher frequencies. The presence of permeability related effects like magnetostatic modes interfering with the normal propagation of the microstrip circuits might be causing the changes in the circuits.Originality/valueThere is scope for true planarisation of ferrite‐based components by using the ferrite in thin film form as in‐touch overlay.
Purpose -The purpose of this paper is to study thickness dependent variation in microwave properties of the Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films and enhancement of power efficiency of Ag thick film EMC patch antenna. Design/methodology/approach -X-band microwave properties of the Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films were measured by superstrate technique using Ag thick film EMC patch antenna as the resonant element. The complex permittivity and permeability of these thick films were also measured by this technique. The microwave response of the EMC patch, complex permeability and permittivity of Mg 0.8 Mn 0.1 Al 0.1 Zn 0.8 Fe 1.2 O 4 and Mg 0.9 Al 0.1 Zn 0.8 Fe 1.2 O 4 thick films and their thickness dependency were investigated. Findings -The XRD patterns reveal the cubic spinel crystal system was obtained for both compositions. The crystallite size obtained was 134.68 nm for Mg 0.8 Mn 0.1 Al 0.1 Zn 0.8 Fe 1.2 O 4 and 155.99 nm for Mg 0.9 Al 0.1 Zn 0.8 Fe 1.2 O 4 The superstrate technique has been used successfully to evaluate the complex permittivity and permeability of the ferrite thick films in the X band. The EMC patch also show thickness and composition dependent frequency agility and enhancement of power efficiency. Originality/value -The complex permeability of Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films measured by superstrate technique is reported in this paper. The superstrate of Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films makes the Ag thick film EMC patch antenna frequency agile and power amplification is obtained.
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