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Purpose -The purpose of this paper is to study thickness dependent variation in microwave properties of the Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films and enhancement of power efficiency of Ag thick film EMC patch antenna. Design/methodology/approach -X-band microwave properties of the Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films were measured by superstrate technique using Ag thick film EMC patch antenna as the resonant element. The complex permittivity and permeability of these thick films were also measured by this technique. The microwave response of the EMC patch, complex permeability and permittivity of Mg 0.8 Mn 0.1 Al 0.1 Zn 0.8 Fe 1.2 O 4 and Mg 0.9 Al 0.1 Zn 0.8 Fe 1.2 O 4 thick films and their thickness dependency were investigated. Findings -The XRD patterns reveal the cubic spinel crystal system was obtained for both compositions. The crystallite size obtained was 134.68 nm for Mg 0.8 Mn 0.1 Al 0.1 Zn 0.8 Fe 1.2 O 4 and 155.99 nm for Mg 0.9 Al 0.1 Zn 0.8 Fe 1.2 O 4 The superstrate technique has been used successfully to evaluate the complex permittivity and permeability of the ferrite thick films in the X band. The EMC patch also show thickness and composition dependent frequency agility and enhancement of power efficiency. Originality/value -The complex permeability of Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films measured by superstrate technique is reported in this paper. The superstrate of Mg x Mn (0.92 x) Al 0.1 Zn 0.8 Fe 1.2 O 4 (x ¼ 0.8, 0.9) thick films makes the Ag thick film EMC patch antenna frequency agile and power amplification is obtained.

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