Abstract-This paper presents a new method that accurately determines the characteristic impedance of planar transmission lines printed on lossy dielectrics even when contact-pad capacitance and conductance are large. We demonstrate the method on a coplanar waveguide fabricated on fused silica and a microstrip line fabricated on a highly conductive silicon substrate.
We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The algorithm features a robust, yet efficient, search algorithm, an error analysis that includes both random and systematic errors, a full covariance matrix relating calibration and measurement errors, 95% coverage factors, and an easy-to-use user interface that supports a wide variety of calibration standards. We also discuss evidence that the algorithm outperforms the MultiCal software package in the presence of measurement errors and accurately estimates the uncertainty of its results.
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