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Texture measurement with short-wave X-ray synchrotron radiation in the range of ! 9 0.1 A Ê is described. The measurements were carried out with the multipurpose diffraction instrument at the high-®eld wiggler, high-energy beamline BW5 at HASYLAB. The instrument was equipped with an on-line image-plate area detector for diffraction-image registration and a Eulerian cradle for sample orientation. The particular features of texture measurement with the BW5 instrument are: good resolution in the Bragg angle, extremely high angular resolution in crystal orientation (pole-®gure angles) and particularly high penetration depth of several millimetres to centimetres, comparable with that of neutrons but at high spatial resolution. Several examples illustrate the particular advantages of this method for texture studies using large or encased samples (in situ studies in complicated environments, such as cryostats, furnaces, vacuum or pressure chambers, with no serious window problems). This allows, among others, non-destructive texture analysis in technological parts and whole components. Because of the extremely high beam intensity (short exposure times) compared with all other methods of texture measurement, the new technique is particularly suited for the study of large sample series (as is often necessary in industrial applications).

The orientation distribution of the Widmannsta È tten plates was measured in a sample of the Gibeon iron±nickel meteorite. The measurements were made with high-energy synchrotron radiation at beamline BW5 at HASYLAB/DESY in Hamburg using a high-resolution`moving-detector' technique. The measurements reveal a continuous range of orientations stretching out from both sides of the Nishiyama±Wassermann orientation to the Kurdjumov±Sachs orientations, as well as a minor`spread-pipe' between the Kurdjumov±Sachs ends of neighbouring non-coplanar orientation variants.

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The texture of a material can be calculated from several pole ®gures, which, in turn, are usually measured by one of several`step-scan' techniques. In these techniques, the ®nite step width limits the attainable orientation resolving power. In the present paper, the discontinuous step-scan technique is replaced by a continuous`sweeping' technique based on the continuous movement of an area detector during exposure. In this way, continuous two-dimensional`images' of pole ®gures are obtained, without the necessity of interpolation. Similar sweeping techniques are also being used to obtain continuous images of other sections and projections of the six-dimensional`orientation±location' space which characterizes a polycrystalline structure completely. The high potential orientation and/or location resolving power of these imaging techniques can only be reached with synchrotron radiation. In the present paper, the measurements were made at the high-energy (short-wavelength) beamline BW5 at HASYLAB/DESY in Hamburg. The high orientation and location resolving power implies the necessity to distinguish`grain-resolved' textures and microstructures (mainly in recrystallized materials) from`continuous' ones (mainly in deformed materials). Under certain conditions, it is thus possible to obtain the complete six-dimensional`orientation stereology' of grain-resolved microstructures. The new methods are illustrated with several examples, including technological applications.

Simple fabrication of a ferrite-based bulk soft magnet (NiFe2O4) and hard magnet (BaFe12O19) using the extrusion free-forming process.

Modern materials science diffractometers are generally equipped with area detectors that allow a high time efficiency to be achieved by simultaneously collecting the scattering pattern over large angular regions. These area‐detector‐based instruments, however, produce a huge amount of data, especially if they are located at large‐scale neutron or synchrotron sources. The software StressTextureCalculator (STeCa) was designed to facilitate fast, easy and automated access to such area‐detector data. Its outstanding features are direct calculation of diffraction patterns from different types of area‐detector measurements, automatic data treatment and peak fitting using several implemented fit options. The resulting information on intensity, peak shift and broadening can then be exported into several data formats. These in turn can be used as input for a wide range of texture, stress and microstructure analysis software packages without additional prior treatment.