No abstract

Vertical stacking of monolayers via van der Waals assembly is an emerging field that opens promising routes toward engineering physical properties of two-dimensional (2D) materials. Industrial exploitation of these engineering heterostructures as robust functional materials still requires bounding their measured properties so to enhance theoretical tractability and assist in experimental designs. Specifically, the shortrange attractive van der Waals forces are responsible for the adhesion of chemically inert components and are recognized to play a dominant role in the functionality of these structures. Here we reliably quantify the the strength of van der Waals forces in terms of an effective Hamaker parameter for CVD-grown graphene and show how it scales by a factor of two or three from single to multiple layers on standard supporting surfaces such as copper or silicon oxide. Furthermore, direct measurements on freestanding graphene provide the means to discern the interplay between the van der Waals potential of graphene and its supporting substrate. Our results demonstrated that the underlying substrates could enhance or reduce the van der Waals force of graphene surfaces, and its consequences are explained in terms of a Lifshitz theorybased analytical model.

Since the inception of the atomic force microscope (AFM) in 1986, influential papers have been presented by the community and tremendous advances have been reported. Being able to routinely image conductive and non-conductive surfaces in air, liquid and vacuum environments with nanoscale, and sometimes atomic, resolution, the AFM has long been perceived by many as the instrument to unlock the nanoscale. From exploiting a basic form of Hooke's law to interpret AFM data to interpreting a seeming zoo of maps in the more advanced multifrequency methods however, an inflection point has been reached. Here, we discuss this evolution, from the fundamental dilemmas that arose in the beginning, to the exploitation of computer sciences, from machine learning to big data, hoping to guide the newcomer and inspire the experimenter.

In this work, we study the surface energy of monolayer, bilayer and multilayer graphene coatings, produced through exfoliation of natural graphite flakes and chemical vapor deposition.

We report a power law derived from experimental atomic force microscopy (AFM) data suggesting a nano to mesoscale transition in force-distance dependencies. Our results are in relative agreement with the Hamaker and Lifshitz theories for van der Waals forces for the larger tip radii only.

The purpose of this work is to show the impact of various thermal models used in predicting the module temperature on the power output of PV modules installed in the UAE. As it is known, the module temperature of PV affects its electrical power output. In this regard we developed a three-dimensional thermal model to predict the temperature of PV modules using finite element method (FEM). Our model was compared with some simple thermal models used by certain software packages and simple correlations in the literatures to predict the module temperature of PV. We used field data from our PV testing facility to validate both the thermal and electrical output of all models used in this work. From the results, all the thermal models were found to underestimate the module temperature of PV operating in the UAE. When the thermal models were used in the twodiode model with other parameters to predict the power output of the module, the results show that they all overestimate the power output with our model being the most accurate and the least biased among all the models considered.

Establishing the presence or absence of nanoscale compositional heterogeneity with nanoscale resolution is becoming instrumental for the development of many fields of science. Force versus distance measurements and parameters directly or indirectly derived from these profiles can be potentially employed for this purpose with sophisticated instruments such as the atomic force microscope (AFM). On the other hand, standards are necessary to reproducibly and conclusively support hypothesis from experimental data and these standards are still emerging. Here, we define a set of standards for providing data originating from atomic force measurements to be employed to compare between sample properties, parameters, or, more generally, compositional heterogeneity. We show that reporting the mean and standard deviation only might lead to inconsistent conclusions. The fundamental principle behind our investigation deals with the very definition of reproducibility and repeatability in terms of accuracy and precision, and we establish general criteria to ensure that these hold without the need of restricting assumptions.

We demonstrate that surfaces presenting heterogeneous and atomically flat domains can be directly and rapidly discriminated via robust intensive quantifiables by exploiting one-pass noninvasive methods in standard atomic force microscopy (AFM), single ∼2 min passes, or direct force reconstruction, i.e., ∼103 force profiles (∼10 min collection time), allowing data collection, interpretation, and presentation in under 20 min, including experimental AFM preparation and excluding only sample fabrication, in situ and without extra experimental or time load. We employ a misfit SnTiS3 compound as a model system. Such heterostructures can be exploited as multifunctional surface systems and provide multiple support sites with distinguishable chemical, mechanical, or opto-electronic distinct properties. In short, they provide an ideal model system to exemplify how current AFM methods can significantly support material discovery across fields.