Crystalline films of silicon were prepared on a tungsten substrate by vacuum evaporation. The method used here was evaporation of silicon on a tungsten substrate, on which thin gold film was predeposited, keeping the substrate at 600–800°C. Growth of plane crystals or whisker crystals was observed depending on growth conditions such as substrate temperature, thickness of gold film and evaporation rate. The sizes of grown plane crystals were as large as several hundreds microns. Their orientation is (111) plane parallel to the substrate and their conductivity is n-type. The details of the growing technique and the examination of grown films will be explained and growth mechanism will be discussed.
CD profile control systems are usefull for improvement on the quality of paper sheet. By the middle of 1986, CD profile systems had been installed about 80 systems in Japan. This paper presents some experience with basis weight and caliper CD profile control.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.