We apply machine learning to automate the root cause analysis in agile software testing environments. In particular, we extract relevant features from raw log data after interviewing testing engineers (human experts). Initial efforts are put into clustering the unlabeled data, and despite obtaining weak correlations between several clusters and failure root causes, the vagueness in the rest of the clusters leads to the consideration of labeling. A new round of interviews with the testing engineers leads to the definition of five ground-truth categories. Using manually labeled data, we train artificial neural networks that either classify the data or pre-process it for clustering. The resulting method achieves an accuracy of 88.9%. The methodology of this paper serves as a prototype or baseline approach for the extraction of expert knowledge and its adaptation to machine learning techniques for root cause analysis in agile environments.
Electrical impedance tomography (EIT) does imaging by solving a nonlinear ill-posed inverse problem. Recently, there has been an increasing interest in solving this problem with artificial neural networks. However, a systematic understanding of the optimal neural network architecture for this problem is still lacking. This paper compares the performance of different multilayer perceptron algorithms for detecting the location of an anomaly on a sensing surface by solving the EIT inverse problem. We generate synthetic data with varying anomaly sizes/locations and compare a wide range of multilayer perceptron algorithms by simulations. Our results indicate that increasing the dimensions of the perceptron improves performance, but this improvement saturates soon. The best performance is achieved when using the multilayer perceptron for regression and Gaussian noise addition as the regularization method.
Electrical impedance tomography (EIT) has been successfully applied to several important application domains such as medicine, geophysics and industrial imaging. EIT offers a high temporal resolution, which allows to track the location of a moving target on a conductive surface accurately. Existing EIT methods are geared towards high image quality instead of smooth target trajectories, which makes them suboptimal for target tracking. We combine EIT methods with hidden Markov models for tracking moving targets on a conductive surface. Numerical experiments indicate that the proposed method outperforms existing EIT methods in target tracking accuracy.
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