Small Angle Neutron Scattering (SANS) technique allows characterizing the nanomicrostructure of the ferritic Oxide Dispersion Strengthened (ODS) steels which are candidates for the structure material of fusion reactor and fast reactor. A SANS study of domestic ferritic ODS alloys are presented. The main objective is to study the evolution of the oxide dispersion nanoparticle during the different stages of the fabrication and different content.
In order to make best use of the neutron flux, a polarized neutron reflectometry with vertical sample geometry is simulated by Vitess package based on Monte Carlo method. The results prove that the neutron flux gain up to a factor reaches 4.3 and the vertical neutron angle divergence is proved, when the optimal tilting angle of the vertically focusing geranium monochromator is 1.3°. At last the optimal separations of horizontal blades of slit packages are optimized. The parameters can be an instruction for polarized neutron reflectometry construction or project analysis in the future.
Product platform is a set of subsystems and interfaces that form a common structure from which a stream of related products can be efficiently developed and produced. Core capability is a key driver for successful product platform development and core technology is the basis of all competitive strategies for high-tech enterprises and their products, and the core products supported by it is the physical embodiment of core competence.
The reversal process of an exchange spring trilayer was studied by micromagnetic simulation, simulating the hysteresis loop and magnetic domain wall structure of a soft/hard/soft ferromagnetic exchange spring. The exchange spring effect was observed, determining the chirality of its spiral magnetization configuration. By simulation of the domain wall structure, we find that reversal nucleation emerge simultaneously in either surface of two soft layers and the magnetic moments of hard layer start rotation at reversible stage.
Three alternate TiN/AlN nanostructured multilayers with the TiN layer thicknesses of 60, 70, and 120 Å and the AlN layer thickness of 10 Å were fabricated using dc reactive magnetron sputtering. Microstructural characterizations of the three nano-scale films were performed using nonpolarized specular neutron reflectometry. The results showed that the three TiN/AlN multilayer thin films were typical superlattice films and the thicknesses of the TiN layer and AlN layer in the multilayers were consistent with the design thickness nearly. The interface roughness was asymmetric in all the samples. The interface of AlN growing on TiN was much sharper than that of TiN growing on AlN and the latter was the diffusion interface in the TiN/AlN multilayer films.
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