Modern mathematical models for automatic analysis of electrical characteristics of integrated circuits are considered. The requirements for the analysis programs are formulated. A comparative analysis of machine methods for calculating integrated circuits is carried out in terms of their accuracy, RAM volumes and calculation time. The features of the development of modern automation tools for designing integrated circuits are considered. One of the main tasks of designing an integrated circuit is a schematic analysis, which must be carried out both at the preliminary stage and after the development of the integrated circuit topology. However, it is possible to identify the main re-quirements that a modern analysis program must meet: reliability - stable calculation of a wide class of electronic circuits, obtaining solutions even for poorly conditioned tasks; high performance - this requirement is especially important when calculating BIS, in tasks of multivariate analysis, such as statistical analysis, and optimization; low costs of machine memory and expansion of the maximum permissible complexity of the analyzed circuits; flexibility, the possibility of making changes to the program, in particular, the replacement of mathematical models of circuit components, the introduction of new models, the improvement of the computational algorithm, the inclusion of the pro-gram in more complex programs, etc.; the availability of convenient input and output of initial information.
The article is devoted to the process of creating microelectronic devices and analyzing methods and criteria for product rejection. We consider procedures that ensure high quality of work of chip design processes and their serial production. The result of the analysis of domestic and foreign patents for multi-core processor systems is presented.
The article considers the issues of reliability control in the development of chips. A reliability control scheme is provided for analyzing the States of major elements and accounting for failures. The paper describes the rejection tests, the sequence of their conduct, as well as the results of the analysis of methods and conditions of testing
The article describes a microcircuit intended for certification of CMOS technology for the production of RS LSI on SPS structures. Its general and technical characteristics are considered. The description and substantiation of the construction, which unites variables by switching layers, allows to implement library elements. The library of elements of the base matrix crystal is considered: its composition and development features. Formulas for calculating the signal delay by the bistable method and estimating the duration of the front of the response of an element at its output are given.
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