To reduce VLSI turnaround t i m e and c o s t , an e f f i c i e n t f a u l t d i a g n o s i s method must be developed.Electron-beam probing, which allows observation of t h e s i g n a l values w i t h i n a chip, i s one of t h e promising approaches f o r f a u l t diagnosis. However, i t i s s t r o n g l y d e s i r e d t h a t t h e number of probes be reduced; otherwise, a g r e a t d e a l of e f f o r t r e s u l t s . The electron-beam probing, guided by deduction based on i m p l i c a t i o n s of i n t e r n a l s i g n a l v a l u e s [ 6 ] , i s considered one of t h e e f f e c t i v e s o l u t i o n s t o t h i s problem. Here t h i s idea i s b u i l t upon by adding preprocessing t o f u r t h e r reduce t h e number of probes and postprocessing t o improve t h e diagnosis r e s o l u t i o n . The method proposed e f f i c i e n t l y diagnoses m u l t i p l e stuck-at f a u l t s i n combinational c i r c u i t s . Using computational experiments i t i s a l s o shown t h a t almost a l l of t h e f a u l t s are diagnosed by probing about 15 p e r c e n t of t h e n e t s when t e s t p a t t e r n s f o r d e t e c t i n g s i n g l e stuck-at f a u l t s are used. 1. I n t r o d u c t i o n Although more and more d i f f e r e n t kinds of VLSI products are being produced, t h e small volume of each type demands development of an e f f i c i e n t f a u l t d i a g n o s i s method i n o r d e r t o reduce both turnaround t i m e and cost. I n t h e development phase t h e capabili t y t o diagnose m u l t i p l e f a u l t s is e s p e c i a ll y d e s i r e d . A number of d i a g n o s i s methods have s o f a r been proposed. However, each h a s some p r a c t i c a l use problems. I n t h e f a u l t dic-21 t i o n a r y method, which s t o r e s t h e abnormal o u t p u t s f o r v a r i o u s f a u l t s i n a d i c t i o n a r y and compares them a g a i n s t t h e observed outp u t s [ 11 , t h e s i z e of t h e d i c t i o n a r y becomes very l a r g e when t h e c i r c u i t s become l a r g e . When m u l t i p l e f a u l t s are considered, t h i s problem becomes prominent and i t i s not p r a c t i c a l . The cause-effect a n a l y s i s method [ 2 ] , i n which f a u l t s are i n f e r r e d from t h e observed o u t p u t v a l u e s without u s i n g a d i c t i o na r y , does not g u a r a n t e e maximum r e s o l u t i o n . which can be probed a t one t i m e i s l i m i t e d , a c o n s i d e r a b l e amount of t i m e i s necessary t o probe a l l of t h e n e t s . Moreover, probing n e t s t h a t are not on t h e t o p l a y e r r e q u i r e s much e f f o r t . A method combining t h e b a s i c o p e r a t i o n of t h e c a u s e -e f f e c t a n a l y s i s method and t h e probing [ 6 ] seems t o have t h e p o s s i b i l i t y of becoming a n e f f i c i e n t diagn o s i s method. r e q u i r e d . c u i t s based on previous r e s e a r c h [ 6 ] and by adding t o i t a preprocessing t o reduce t h e number of probes and a postprocessing ...
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