No abstract

Open spaces in the subsurface region (<10 μm) of very low density polyethylene were probed by a monoenergetic positron beam. From measurements of Doppler broadening spectra measurements of the annihilation radiation and the lifetime spectra of positrons as a function of incident positron energy, the size of the open spaces in the region of 0–3 μm was found to be larger than that in the deeper region. This was attributed to the cooperative motion of large segments of molecules which is activated near the surface. After the freezing in of such motions (below 230 K), although the lineshape parameter S in the bulk was almost constant, S in the region of 0–3 μm decreased with decreasing temperature. This discrepancy was associated with the presence of the open spaces with an excess content and the resultant contraction of amorphous structure near the surface. © 1998 John Wiley & Sons, Inc. J. Polym. Sci. B Polym. Phys. 36: 2597–2605, 1998

Relaxation processes in polyethylene (PE) and polystyrene (PS) were studied by positron annihilation technique. For PE, above the glass transition temperature, Tg, the size of free volumes and its concentration were increased by the micro‐Brownian motion of molecules. For PS, local motions of molecules in backbone chains were found to start above 260 K. However, these local motions were suppressed by an interphenyl correlation. For both PE and PS, below 250–260 K, the formation probability of positronium atoms increased with decreasing temperature. This fact was assigned to the freezing in of the local motions of molecules. For PS, an onset of the local motions of molecules was observed above 100 K. These motions were expected to be associated with liberation of phenyl groups. © 1996 John Wiley & Sons, Inc.

In order to improve the long-term reliability of XLPE cables, it is essential to understand the mechanism of deterioration and breakdown as a result of long-term voltage application. This paper presents the results of our study on the deterioration mechanism of polyethylene, which is the insulating material of XLPE cables, focusing mainly on the electrical deterioration luminescence phenomenon observed using model samples that simulate the regions of high electric field enhancement, e. g., impurities and protrusions. A report is also given on an evaluation of the long-life characteristics of the insulating material, based on electrical deterioration luminescence measurements that take into account the above deterioration mechanism.

No abstract

Although many researchers have investigated voltage life characteristics of XLPE cables, the voltage life curve of XLPE insulation has not been made clear because of large deviations in the obtained data. Moreover, the voltage life curve of a XLPE cable, which is significantly affected by defect size and shape, can not be applied to another cable having different defects. The authors obtained an intrinsic stress life curve of XLPE which included no defects. The intrinsic stress life curve demonstrates the existence of a threshold stress, which causes no degradation in the insulation. The application of the intrinsic stress life curve makes possible to estimate the voltage life curve of any cable with known defects. A method for calculating the defect size that would not initiate any degradation in XLPE insulation under a given electrical stress is proposed.

No abstract

No abstract