By the use of an SSD diffractometer and continuous X-rays, the energy dependences of Af' and Aft' values of Ga have been studied on GaP with energy resolution of about several eV around the Ga K edge; the values of Aft" were determined by the measurement of the absorption coefficient, and then the values of A f" have been obtained from the precisely measured ratio of Friedel-pair reflexions from a (111) single-crystal plate of polar GaP. Fine structures have been found in Aft" and therefore in A f" corresponding to those of the absorption coefficient. The present work has shown that the measured values of A f" more or less reasonably agree with the curves calculated from the dispersion relation.
A formulation of dynamical X-ray diffraction is given for use when studying X-ray diffraction intensities when the real part of the scattering factor is zero. Based on these formulae, the diffraction induced by the imaginary part of the scattering factor alone is studied for both the Bragg and Laue cases.
We have observed condensation of X-rays emitted from an edge of a thin Ge parallel crystal, using X-rays from synchrotron radiation. When highly parallel X-rays with the energy near an absorption edge of an atom or a nucleus are incident on a thin crystal in the Bragg case, a part of X-rays is confined in the crystal and do not come out either from the top or the bottom surface. The density of confined beam increases as the width of the incident beam is increased. The confined beam can come out from an edge of a thin crystal with higher density than the incident beam.
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