p-Type-doped ZnO films were grown on nominally undoped n-ZnO, which is deposited on p-Si:B by electrochemical deposition. The electrical properties of individually doped ZnO:Na/Mg/Sb/Ti films were determined by means of the Hall system at the room temperature. Our results showed that doped ZnO films had high mobility ranging from 11 to 638 cm2/V s, carrier concentration ranging from 6.00 × 1016 to 3.37 ×1019 cm−3, and low resistivity ranging from 1.62 × 10−2 to 21.9 × 10−2 Ω cm. Electroluminescence measurements of obtained homojunctions exhibited three main broad luminescence bands peaking at 2.8, 2.5, and 1.98 eV, respectively. In addition to these broadbands, Fabry–Pérot oscillations were also observed.
In this study, we have investigated the heterojunctions formed by n-ZnO thin films deposited on (100) p-Si:B using electrochemical deposition (ECD) technique. Structural, electrical and luminescence features of the thin films were respectively measured. Optimal sets of growth conditions seem to be the ones that are undergone for the samples D1 and D2. It was observed that n-ZnO thin films have dominantly preferred orientation of (002). It has been shown that the heterostructures exhibited reasonable rectifying behavior with turn-on voltage of about 1.2 V and ideality factor of 2.1. In case of illumination with 400 nm wavelength light, significant increase occurred especially in reverse bias current by a factor of 103 and 102 for the D1 and the D2, respectively. Bandgap of ZnO thin films has been determined to be 3.4 eV at the room temperature by using the band edge photoluminescence measurements. Finally, the room temperature electroluminescence (EL) results show that the heterostructures exhibits observable broad luminescence centered at the wavelengths of 390 and 510 nm for D1 and 470 nm for D2, respectively. Additionally, sharp lasing peaks are also observed in the EL spectra, probably due to the multiple scattering effects
Phone: þ90 442 231 4082, Fax: þ90 442 236 0948 n-ZnO film grown by electrodeposition (ECD) on p-GaAs substrate was characterized by structural, optical, and electrical techniques. X-ray diffraction (XRD) measurement clearly showed formation of ZnO thin film with a strong c-axis (0002) preferential orientation. Photoluminescence (PL) measurements showed that the grown film has a strong and narrow ultraviolet (UV) emission indicating high-quality ZnO thin film. Current-voltage (I-V) measurement of n-ZnO/p-GaAs heterojunction shows diode-like rectifying characteristics with an almost five-order rectification factor and a turn-on voltage of 2 V.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.