This paper proposes a roadmap to address present and future needs in space systems with RISC-V processors. RISC-V is an open and modular instruction set architecture, which is rapidly growing in popularity in terrestrial applications. To satisfy different applications with contrasting requirements in satellite data systems, four different types of processors are identified: 1) low-area/low-power microcontrollers, 2) on-board computers, 3) general-purpose processors for payloads, and 4) enhanced payload processors for artificial intelligence. Several solutions based on RISC-V are proposed for each of these types of processors and compared with proprietary commercial-off-the-shelf and spacegrade solutions. An extensive analysis of the results available from literature is conducted to show that RISC-V has the potential to solve such a wide range of needs. This paper will also show the unprecedented number of open-source implementations and models that were developed in a relative short time on a single instruction set architecture. Future space systems could benefit from many of those developments, and this work identifies and highlights what is still missing to satisfy the specific needs of processors for space, especially in terms of fault tolerance and technology readiness level.
This paper discusses radiation tests on complex System-on-Chip (SoC) controllers using Low-Energy Protons (LEPs). The aim of this novel set of guidelines is to be also applicable to System In Package (SIP) or hybrid components that are now often used to overcome printed circuit board's real estate restrictions in Hi-Rel electronics
The tolerance to the cumulative effects of ionizing radiation is one of the most important parameters to keep into account when selecting an EEE component for space applications. TID sensitivity is normally investigated measuring changes induced by gamma rays from 60 Co sources to nominal parameters of a component or to its expected functional behavior. In this work we propose an on-chip 90 Sr/ 90 Y electron source as an alternative methodology for TID tests. 60 Co and 90 Sr/ 90 Y TID test setups for a complex SoC are compared in terms of complexity and of experimental results, investigating the use of a 90 Sr/ 90 Y as well as the established 60 Co. We show that 90 Sr allows a simpler test setup, manages to reproduce specific modes of failure obtained with 60 Co and causes failures at comparable total doses. This makes 90 Sr an interesting alternative to 60 Co qualification and the use of untested components, to be further investigated especially for complex COTS SoCs.
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