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The solar energetic particle (SEP) radiation environment is an important consideration for spacecraft design, spacecraft mission planning and human spaceflight. Herein is presented an investigation into the likely severity of effects of a very large Solar Particle Event (SPE) on technology and humans in space. Fluences for SPEs derived using statistical models are compared to historical SPEs to verify their appropriateness for use in the analysis which follows. By combining environment tools with tools to model effects behind varying layers of spacecraft shielding it is possible to predict what impact a large SPE would be likely to have on a spacecraft in Near-Earth interplanetary space or geostationary Earth orbit. Also presented is a comparison of results generated using the traditional method of inputting the environment spectra, determined using a statistical model, into effects tools and a new method developed as part of the ESA SEPEM Project allowing for the creation of an effect time series on which statistics, previously applied to the flux data, can be run directly. The SPE environment spectra is determined and presented as energy integrated proton fluence (cm À2 ) as a function of particle energy (in MeV). This is input into the SHIELDOSE-2, MULASSIS, NIEL, GRAS and SEU effects tools to provide the output results. In the case of the new method for analysis, the flux time series is fed directly into the MULASSIS and GEMAT tools integrated into the SEPEM system. The output effect quantities include total ionising dose (in rads), non-ionising energy loss (MeV g À1 ), single event upsets (upsets/bit) and the dose in humans compared to established limits for stochastic (or cancer-causing) effects and tissue reactions (such as acute radiation sickness) in humans given in grey-equivalent and sieverts respectively.

This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed. Abstract-This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed.

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This paper proposes a roadmap to address present and future needs in space systems with RISC-V processors. RISC-V is an open and modular instruction set architecture, which is rapidly growing in popularity in terrestrial applications. To satisfy different applications with contrasting requirements in satellite data systems, four different types of processors are identified: 1) low-area/low-power microcontrollers, 2) on-board computers, 3) general-purpose processors for payloads, and 4) enhanced payload processors for artificial intelligence. Several solutions based on RISC-V are proposed for each of these types of processors and compared with proprietary commercial-off-the-shelf and spacegrade solutions. An extensive analysis of the results available from literature is conducted to show that RISC-V has the potential to solve such a wide range of needs. This paper will also show the unprecedented number of open-source implementations and models that were developed in a relative short time on a single instruction set architecture. Future space systems could benefit from many of those developments, and this work identifies and highlights what is still missing to satisfy the specific needs of processors for space, especially in terms of fault tolerance and technology readiness level.

GANIL/Applications industriellesThe effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles: SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results. Testing to high fluence levels is required to detect rare events. This increases the probability of nuclear interactions. This is typically the case for power MOSFETs, which are tested at high fluences for single event burnout or gate rupture detection, and for single-event-upset (SEU) measurement in SRAMs below the direct ionization threshold. Differences between various test conditions (e.g., "in air" or vacuum irradiations, with or without degraders) are also explored. Nuclear interactions with any materials in the beam's path can increase the number of high collected charge events potentially impacting the experimental results. A "species" effect has been observed in the power MOSFET devices examined in this work. When the beam energy increases, the single-event-burnout (SEB) voltage is constant, such that the SEB voltage is determined only by the species of the ion beam. The species effect is shown to be due to high collected charge events induced by nuclear interactions, which can lead to premature SEB. If a device is sensitive to the species effect, the worst-case test conditions will be for the heaviest ion species, which can produce the largest linear-energy-transfer (LET) secondaries. SRAMs can also be sensitive to the species effect below the direct ionization threshold LET. For the devices used in this work, the worst-case energy for SEU characterization is $sim 10'{rm s}~{rm MeV/u}$ where the species dominates the device response. In the 10's MeV/u range the heaviest species result in the largest cross sections. However, at very high energies (100's MeV/u), the species is not the - ominant parameter because of differences in the population of secondaries created by nuclear interactions. At very high energies the SEU cross section below the direct ionization threshold LET decreases by several orders of magnitude compared to 10's MeV/u SEU data. The results of this work emphasize that there is no such thing as an "ideal" test facility. Nevertheless, these results can be used by experimenters to optimize the integrity of their results for given test conditions