GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.

The supramolecular rearrangements of biopolymers have remained difficult to discern. Here, we present a versatile approach that allows for an in situ investigation of two major types of rearrangements typically observed with cellulose, the most abundant biopolymer on earth. Model thin films were employed to study time-resolved pore size changes using in situ grazing incidence small-angle X-ray scattering (GISAXS) during regeneration and drying.

Pentacene is one of the most studied organic semiconducting materials. While many aspects of the film formation have already been identified in very thin films, this study provides new insight into the transition from the metastable thin-film phase to bulk phase polymorphs. This study focuses on the growth behavior of pentacene within thin films as a function of film thickness ranging from 20 to 300 nm. By employing various X-ray diffraction methods, combined with supporting atomic force microscopy investigations, one crystalline orientation for the thin-film phase is observed, while three differently tilted bulk phase orientations are found. First, bulk phase crystallites grow with their 00L planes parallel to the substrate surface; second, however, crystallites tilted by 0.75° with respect to the substrate are found, which clearly dominate the former in ratio; third, a different bulk phase polymorph with crystallites tilted by 21° is found. The transition from the thin-film phase to the bulk phase is rationalized by the nucleation of the latter at crystal facets of the thin-film-phase crystallites. This leads to a self-limiting growth of the thin-film phase and explains the thickness-dependent phase behavior observed in pentacene thin films, showing that a large amount of material is present in the bulk phase much earlier during the film growth than previously thought.

The synthesis of nanoporous ZnO thin films is achieved through annealing of zinc-alkoxide (“zincone”-like) layers obtained by plasma-enhanced atomic layer deposition (PE-ALD). The zincone-like layers are deposited through sub-saturated PE-ALD adopting diethylzinc and O2 plasma with doses below self-limiting values. Nanoporous ZnO thin films were subsequently obtained by calcination of the zincone-like layers between 100–600 °C. Spectroscopic ellipsometry (SE) and X-ray diffraction (XRD) were adopted in situ during calcination to investigate the removal of carbon impurities, development of controlled porosity, and formation and growth of ZnO crystallites. The layers developed controlled nanoporosity in the range of 1–5%, with pore sizes between 0.27 and 2.00 nm as measured with ellipsometric porosimetry (EP), as a function of the plasma dose and post-annealing temperature. Moreover, the crystallinity and crystallite orientation could be tuned, ranging from a powder-like to a (100) preferential growth in the out-of-plane direction, as measured by synchrotron-radiation grazing incidence XRD. Calcination temperature ranges were identified in which pore formation and subsequent crystal growth occurred, giving insights in the manufacturing of nanoporous ZnO from Zn-based hybrid materials.

The pigment 6,6'-dibromoindigo (Tyrian purple) shows strong intermolecular hydrogen bonds and the film formation is, therefore, expected to be influenced by the polar character of the substrate surface. Thin films of Tyrian purple were prepared by physical vapor deposition on a variety of substrates with different surface energies: from highly polar silicon dioxide surfaces to hydrophobic polymer surfaces. The crystallographic properties were investigated by X-ray diffraction techniques such as X-ray reflectivity and grazing incidence X-ray diffraction. In all cases, crystallites with "standing" molecules relative to the substrate surface were observed independently of the substrate surface energy. In the case of polymer surfaces, additional crystallites are formed containing "lying" molecules with their aromatic planes parallel to the substrate surface. Small differences in the crystallographic lattice constants were observed as a function of substrate surface energy, the corresponding small changes in the molecular packing are explained by a variation of the hydrogen bond geometries. This work reveals that despite the limited influence of the surface energy on the molecular orientation, the crystalline packing of Tyrian purple within thin films is altered and slightly different structures form.