GIDVis: a comprehensive software tool for geometry-independent grazing-incidence X-ray diffraction data analysis and pole-figure calculations

Abstract

GIDVis is a software package based on MATLAB specialized for, but not limited to, the visualization and analysis of grazing-incidence thin-film X-ray diffraction data obtained during sample rotation around the surface normal. GIDVis allows the user to perform detector calibration, data stitching, intensity corrections, standard data evaluation (e.g. cuts and integrations along specific reciprocal-space directions), crystal phase analysis etc. To take full advantage of the measured data in the case of sample rotation, pole figures can easily be calculated from the experimental data for any value of the scattering angle covered. As an example, GIDVis is applied to phase analysis and the evaluation of the epitaxial alignment of pentacenequinone crystallites on a single-crystalline Au(111) surface.

Crystal alignment of surface stabilized polymorph in thioindigo films

“…evaluation of the inplane alignment of the crystallites, the data from the 150 images of distinct azimuths can be used to calculate pole figures for different interplanar distances. Conversion of the measured data to reciprocal space, crystal phase analysis and pole figure generation were performed using GIDVis [28]. The orientational analysis of the pole figure evaluation was performed using the software Stereopole [29].…”

Mesoporous ZnO thin films obtained from molecular layer deposited “zincones”

“…The recorded intensity maps were transferred into the reciprocal space and plotted via the software package GIDVis. 47 The value of the scattering vector (q) can then be used to calculate real space distances (d ) via the Debye-Scherrer equation d = 2π/q. 48 Atomic force microscopy (AFM) was performed in noncontact mode on a Nanosurf Easyscan 2, equipped with a PPP-NCLR-10 cantilever (NanoWorld AG, Switzerland).…”

Epitaxial Order Driven by Surface Corrugation: Quinquephenyl Crystals on a Cu(110)-(2×1)O Surface

“…distribution of poles (net plane normals) within the film [25]. A recent development allows the measurements of pole figures by using synchrotron radiation; grazing incidence X-ray diffraction is combined with rotating thin film samples [26]. The analysis of the experimental data is based on the crystal structure of 5P.…”