Porous polymeric films are promising materials for the production of ultralow-dielectric constant materials. A high porosity polyimide thin film was prepared via the phase separation of a polyimide precursor in an N,N-dimethylacetamide (solvent)/2-(diethylamino)ethyl methacrylate/photoinitiator system. A novel technique involving high-pressure CO 2 (5 MPa) gas injection was used to form CO 2 -2-(diethylamino)ethyl methacrylate zwitterion salt and induce the immediate phase separation and solvent droplet formation (within 60 s) of a wet precursor film on a metal substrate. The film was exposed to UV light through quartz windows for 30 s to polymerize the 2-(diethylamino)ethyl methacrylate while maintaining a constant CO 2 pressure. The cured thin film containing numerous pores with an average diameter of approximately 1 μm ± 1.0 μm was treated at 320 °C for 1 h under a continuous flow of nitrogen. The obtained film was 30 μm thick and exhibited pores with an average diameter of approximately 1 μm ± 0.9 μm. The ultralow-k level minimum relative dielectric constant for the optimal polyimide film was 1.536, and the porosity was 74% with open porous structure.
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