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An X-ray Talbot interferometer consisting of two capillary plates, which were used as X-ray amplitude gratings, was evaluated for X-ray phase imaging. A theoretical aspect of capillary X-ray Talbot interferometry is presented with a preliminary operation result using synchrotron radiation. A two-dimensional X-ray Talbot effect, or self-imaging effect, which was the basis of Talbot interferometry, was observed with the capillary plate, and moiré images formed by the X-ray Talbot interferometer exhibited contrasts corresponding to the differential phase shift caused by phase objects placed in front of the interferometer. Finally, the possibility of quantitative phase measurement with a fringe scanning technique is discussed.

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Chalcogenide materials have regained attention after the recent recognition of the compatibility of transition metal dichalcogenides with graphene. Additionally, there has been a recent appreciation for the rich variety of properties they support due to the anomalies in the materials’ intrinsic band structure. These materials generally have layered structures and weak interlayer connection through the chalcogen layer and its van der Waals type bonding. We have synthesized orthorhombic copper telluride and measured its electrical transport properties. The results of these measurements reveal that the conduction is metallic in both the in-plane and out-of-plane directions. The range of stability of this structure is examined along with the lattice constants. The independence of the resistivity in samples to changes in excess copper indicates that the transport is essentially within the conducting planes. This result shows that the material hosts two-dimensional character likely due to its covalent interlayer bonding.