As CMOS technology scaling pushes towards the reduction of the length of transistors, electronic circuits face numerous reliability issues, and in particular nodes of D-latches at nano-scale confront multiple-node upset errors due to their operation in harsh radiative environments. In this manuscript, a new high reliable D-latch which can tolerate quadruple-node upsets is presented. The design is based on a low-cost single event double-upset tolerant (LSEDUT) cell and a clock-gating triple-level soft-error interceptive module (CG-SIM). Due to its LSEDUT base, it can tolerate two upsets, but the combination of two LSEDUTs and the triple-level CG-SIM provides the proposed D-latch with remarkable quadruple-node upsets (QNU) tolerance. Applying LSEDUTs for designing a QNU-tolerant D-latch improves considerably its features; in particular, this approach enhances its reliability against process variations, such as threshold voltage and (W/L) transistor variability, compared to previous QNU-tolerant D-latches and double-node-upset tolerant latches. Furthermore, the proposed D-latch not only tolerates QNUs, but it also features a clear advantage in comparison with the previous clock gating-based quadruple-node-upset-tolerant (QNUTL-CG) D-latch: it can mask single event transients. Specific figures of merit endorse the gains introduced by the new design: compared with the QNUTL-CG D-latch, the improvements of the maximum standard deviations of the gate delay, induced by threshold voltage and (W/L) transistors variability of the proposed D-latch, are 13.8% and 5.7%, respectively. Also, the proposed D-latch has 23% lesser maximum standard deviation in power consumption, resulting from threshold voltage variability, when compared to the QNUTL-CG D-latch.INDEX TERMS Power-delay product (PDP), soft errors (SE), single event upset (SEU), high impedance state (HIS), single event transient (SET), dual interlocked storage cell (DICE), triple path DICE (TPDICE), quadruple-node upsets (QNUs).
This paper presents a new low power and high speed full adder based on Carbon Nano Tube Field Effect Transistor (CNTFET) technology. This proposed full adder is based on a XOR logic function using 32 nm CNTFET technology. The MOSFET-like CNTFET is applied in this paper to use CMOS (Complementary Metal Oxide Semiconductor) logic gate. The better structure of CNTFET transistors can improve the performance of full adder based on CNTFET technology [1]. The proposed full adder is simulated in different frequencies, various supply voltages, temperatures and load capacitances to prove better performance in different conditions using the Synopsys HSPICE simulator software in comparison with previous full adders in CNTFET technology.
In this paper, a Soft Error Hardened D-latch with improved performance is proposed, also featuring Single Event Upset (SEU) and Single Event Transient (SET) immunity. This novel D-latch can tolerate particles as charge injection in different internal nodes, as well as the input and output nodes. The performance of the new circuit has been assessed through different key parameters, such as power consumption, delay, Power-Delay Product (PDP) at various frequencies, voltage, temperature, and process variations. A set of simulations has been set up to benchmark the new proposed D-latch in comparison to previous D-latches, such as the Static D-latch, TPDICE-based D-latch, LSEH-1 and DICE D-latches. A comparison between these simulations proves that the proposed D-latch not only has a better immunity, but also features lower power consumption, delay, PDP, and area footprint. Moreover, the impact of temperature and process variations, such as aspect ratio (W/L) and threshold voltage transistor variability, on the proposed D-latch with regard to previous D-latches is investigated. Specifically, the delay and PDP of the proposed D-latch improves by 60.3% and 3.67%, respectively, when compared to the reference Static D-latch. Furthermore, the standard deviation of the threshold voltage transistor variability impact on the delay improved by 3.2%, while its impact on the power consumption improves by 9.1%. Finally, it is shown that the standard deviation of the (W/L) transistor variability on the power consumption is improved by 56.2%.
This paper presents a low-cost, self-recoverable, double-node upset tolerant latch aiming at nourishing the lack of these devices in the state of the art, especially featuring self-recoverability while maintaining a low-cost profile. Thus, this D-latch may be useful for high reliability and high-performance safety-critical applications as it can detect and recover faults happening during holding time in harsh radiation environments. The proposed D-latch design is based on a low-cost single event double-node upset tolerant latch and a rule-based double-node upset (DNU) tolerant latch which provides it with the self-recoverability against DNU, but paired with a low transistor count and high performance. Simulation waveforms support the achievements and demonstrate that this new D-latch is fully self-recoverable against double-node upset. In addition, the minimum improvement of the delay-power-area product of the proposed rule-based design for the low-cost DNU tolerant self-recoverable latch (RB-LDNUR) is 59%, compared with the latest DNU self-recoverable latch on the literature.INDEX TERMS Delay-power-area product (DPAP), Double node upsets (DNU), High impedance state (HIS), Low cost single event double node upset tolerant (LSEDUT), Power-delay product (PDP), Single node upset (SNU), Soft error (SE).
Scaling down the size of transistor in the nanoscale reduces the power supply voltage, as a result, the design of high-performance nano-circuit at low voltage has been considered. Most of digital circuits are composed of different components which determine the performance of the entire digital circuits. With the improvement of these components, the digital circuits can be optimized. One of these components is full adder for which various structures have been proposed to improve its performance, among them the two novel full adder structures are based on Gate-Diffusion Input (GDI) structure and half-classical XOR/XNOR logic (SEMI XOR/XNOR) modules. In this paper, Carbon Nanotube Field Effect Transistor (CNTFET)-based low power full adders by using SEMI XOR logic style and GDI structure are presented. Due to the incomparable thermal and mechanical properties of the CNTFET, it can be the first alternative to substitute the metal oxide field effect transistors (MOSFET). The digital circuits have the better performance based on CNTFET. Therefore, the three proposed full adders in this paper are designed based on CNTFET technology with many merits, such as low power dissipation, less energy delay product (EDP), and high speed at various supply voltages, frequencies, temperatures, load capacitors, and the number of tubes. Moreover, these proposed full adders occupy the minimum area consumption and have better performance in comparison with previous standard full adders. All simulations are done by using the Synopsys HSPICE simulator in 32 nm-CNTFET technology and layout of all full adder circuits are presented on Electric.
The endeavor to overcome problems of complementary metal oxide semiconductor technology makes the advent of Carbon nanotube field effect transistor (CNTFET). Improvement of structure transistor CNTFET makes higher mobility and electrostatics of gate electrons. Therefore, many analog circuits are now designed based on CNTFET technology. This paper presents a low power current mode four-quadrant analog multiplier based on CNTFET and CMOS technologies. All simulations were done with the synopsys Hspice simulator using 32nm CNTFET model from Stanford University and 32nm CMOS from PTM library at a supply voltage of 3.3 v. It was shown that the simulation of a multiplier based on CNTFET technology performs better than a multiplier based on CMOS technology.
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