An EXAFS (extended x-ray-absorption fine structure) study of nanocrystalline iron prepared by high-energy ball milling is presented. Accurate data analysis has been performed using a recently developed ab initio multiple-scattering
Abstract. The decrease of the mean Si-O-Si angle in vitreous silica upon densification from 2.20 to 2.36 gcm -3 has been followed by oxygen and silicon K-edge XANES spectroscopy. Multiple scattering calculations using clusters of two shells around the oxygen and silicon atoms, respectively, are in good agreement with experimental absorption spectra and confirm mean Si-O-Si angles between 130 and 144 ~ for these samples, and a decrease of the mean angle with densification. The experimental spectra also exhibit features due to scattering at outer (>2) shells around the photoabsorbers.
The local structure at the V site is investigated by polarized X-ray absorption spectroscopy in vanadium pentoxide gel V2051 .6H20. Polarized absorption spectra allows to separate experimentally the contribution of neighbour atoms in different directions. EXAFS
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